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10.1063/1.5116717
2019-12-16
A transition-edge sensor-based x-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap
aip.org
© 2019 U.S. Government
10.1063/1.5116717
https://doi.org/10.1063/1.5116717
VoR
doi:10.1063/1.5116717
Review of Scientific Instruments
application/pdf
AIP Publishing, LLC
A transition-edge sensor-based x-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap
P. Szypryt
G. C. O’Neil
E. Takacs
J. N. Tan
S. W. Buechele
A. S. Naing
D. A. Bennett
W. B. Doriese
M. Durkin
J. W. Fowler
J. D. Gard
G. C. Hilton
K. M. Morgan
C. D. Reintsema
D. R. Schmidt
D. S. Swetz
J. N. Ullom
Yu. Ralchenko
Rev. Sci. Instrum. 2019.90:123107
2019-12-16
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10.1063/1.5116717
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