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application/pdfIEEE2018 Conference on Precision Electromagnetic Measurements (CPEM 2018);2018; ; ; high resistancestandard resistordual source bridgevoltage injectionuncertainty10 TΩ and 100 TΩ Resistance Comparison Between NIST and AISTDean G. JarrettTakehiko OeNobu-Hisa KanekoShamith U. Payagala
2018 Conference on Precision Electromagnetic Measurements (CPEM 2018)1 July 20182
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