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application/pdfIEEEIEEE Transactions on Microwave Theory and Techniques;2015;63;7;10.1109/TMTT.2015.2432765Microwave measurements uncertaintymicrowave transistorsnonlinear de-embeddingvector-calibrated nonlinear measurementsEvaluation of Uncertainty in Temporal Waveforms of Microwave TransistorsGustavo AvolioAntonio RaffoJeffrey JargonPaul D. HaleDominique M. M.-P. SchreursDylan F. Williams
IEEE Transactions on Microwave Theory and Techniques2353 July 201576310.1109/TMTT.2015.24327652363
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