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XT.07 Spin Dependent Recombination Study of the Atomic-Scale Effects of Fluorine on the Negative Bias Temperature Instability
XT - Transistor and BTI and Hot Carrier Posters
J. T. Ryan, P. M. Lenahan, A. T. Krishnan, S. Krishnan and J. P. Campbell
2009-02-25T09:30:29-08:00
2010-07-27T13:11:24-04:00
InControl Productions, Inc.
2010-07-27T13:11:24-04:00
Acrobat Distiller 8.1.0 (Windows); modified using iText 2.1.7 by 1T3XT
XT.07 Spin Dependent Recombination Study of the Atomic-Scale Effects of Fluorine on the Negative Bias Temperature Instability
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