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February 6 to February 10, 2012

The NIST Technicalendar is issued each Friday. All items MUST be submitted electronically from this web page by 12:00 NOON each Wednesday unless otherwise stated in the NIST Technicalendar. The address for online weekly editions of the NIST Technicalendar and NIST Administrative Calendar is: http://www.nist.gov/tcal.

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Meetings Elsewhere
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AT A GLANCE - MEETINGS AT NIST

MONDAY - 2/6
10:30 AM - SiN Based On-Chip Micro-resonator Frequency Combs and Application to Optical Arbitrary Waveform Generation
TUESDAY - 2/7
10:45 AM - The Role of Water and/or Morphology in Ion Transport in Novel Ionomers
WEDNESDAY - 2/8
No Scheduled Events
THURSDAY - 2/9
No Scheduled Events
FRIDAY - 2/10
10:30 AM - A Demographic Look at the Near Future

MEETINGS AT NIST

2/6 -- MONDAY

10:30 AM - CNST NANOFABRICATION RESEARCH GROUP SEMINAR: SiN Based On-Chip Micro-resonator Frequency Combs and Application to Optical Arbitrary Waveform Generation
Recently, on-chip comb generation methods based on nonlinear optical modulation in ultrahigh quality factor monolithic micro-resonators have been demonstrated, where two pump photons are transformed into sideband photons in a four wave mixing process mediated by the Kerr nonlinearity. We investigate line-by-line pulse shaping of such combs generated in silicon nitride ring resonators. We observe two distinct paths to comb formation which exhibit strikingly different time domain behaviors. For combs formed as a cascade of sidebands spaced by a single free spectral range (FSR) that spread from the pump termed as type I, we are able to stably compress to nearly bandwidth-limited pulses. This indicates high coherence across the spectra and provides new data on the high passive stability of the spectral phase. For combs where the initial sidebands are spaced by multiple FSRs which then fill in to give combs with single FSR spacing termed as type II, the time domain data reveal partially coherent behavior. We also investigate the behaviors of a few subfamilies of type II combs selected by a pulse shaper. We observe different coherent properties for different groups of comb lines.
Fahmida Ferdous , Research Assistant/Purdue University, West Lafayette, IN.
217 Bldg, Rm. H107C. (NIST Contact: Vladimir Aksyuk, 301-975-2867, vladimir.aksyuk@nist.gov)



2/7 -- TUESDAY

10:45 AM - NIST CENTER FOR NEUTRON RESEARCH SEMINAR: The Role of Water and/or Morphology in Ion Transport in Novel Ionomers
Proton exchange membrane (PEM) fuel cells are still the most desirable energy conversion device for future zero emission, high efficiency automobiles. However, their unit cost, ease of operation, and reliability must be reduced which includes eliminating the humidifier from the fuel cell system. Currently the commercial proton exchange membrane (PEM) is fabricated from a perfluorosulfonic acid (PFSA) polymer such as Nafion. Unfortunately PFSA ionomers must be fully hydrated to achieve practical levels of proton conductivity which can only be achieved in vehicles operating at an inlet RH of 80% which still necessitates the use of a humidifier and undesirable complex water management and recovery. To achieve the goal of a PEM that can operate at temperatures from freezing to 120C using dry inlet gases it will be necessary to develop new PEMs that are based on new chemistries or dramatically improved morphologies of existing chemistries. Additionally it is necessary to have precious metal catalysts in acid to catalyze fuel cell reactions and so it would be desirable to develop alkaline exchange membrane (AEM) fuel cells which in principle could utilize less expensive metals as the catalysts. They are developing a wide variety of ionomer materials for energy conversion applications, the properties of which depend strongly on their morphology and water content. Because of this they have made extensive use of SAXS using the synchrotron radiation of beamline 12 C/D or B at the APS. Here they have been able to not only perform environmental measurements at conditions relevant to fuel cell operation, but they have been able to follow the dynamics of morphological changes induced by humidity or temperature changes. In this talk the speaker will show some of this data for Perfluorosulfonic acid materials, their derivatives and composites produced in collaboration with 3M. He will also show data for novel hybrid inorganic polymeric materials based on heteropoly acids or zirconium phosphonate where the SAXS is dominated by the electron dese scatterers. Finally I will discuss novel AEMs both random and structured diblock materials fabricated at CSM and U. Mass Amherst.
Andrew Herring , Colorado School of Mines.
235 Bldg, Rm. K04B. (NIST Contact: Daniel Hussey, 301-975-6465, daniel.hussey@nist.gov)



2/8 -- WEDNESDAY

No Scheduled Events

2/9 -- THURSDAY

No Scheduled Events

2/10 -- FRIDAY

10:30 AM - NIST COLLOQUIUM SERIES: A Demographic Look at the Near Future
Howard Hogan Chief Demographer U.S. Census Bureau Looking at information gathered from the recent census together with other Census Bureau surveys, estimates and projections illuminates demographic trends that affect the nation's economy and welfare in the near future. Important issues include population growth, the aging of the baby boomers, racial and ethnic diversity, immigration, language diversity, living arrangements, trends in household economics, and the status of women.
Howard Hogan , A Demographic Look at the Near Future.
Administration Bldg, Green Auditorium. (NIST Contact: Heather Evans, 301-975-4525, heather.evans@nist.gov)
Special Assistance Available



ADVANCE NOTICE

2/14/12 10:30 AM - PHYSICAL MEASUREMENT LABORATORY OFFICE SEMINAR: Quantum Measurement Division Seminar: Applied Electrical Metrology Group
The Applied Electrical Metrology Group provides U.S. industry with the essential links between ac voltage, current, power, and energy and NIST-realized SI standards. We have a legacy of supporting the electric power industry since its infancy through research and measurement services for devices used for monitoring the power grid such as instrument transformers, and electric power and energy meters. The Group continues to support the industry today in measurements of synchrophasors that are used for monitoring real-time power grid conditions, and in standards developed for the Smart Grid. We also provide the link between ac voltage and the corresponding dc electrical standards through cutting-edge research and development in ac-dc difference measurement. This seminar will provide an overview of the people and activities of the AEM Group, including how we now employ quantum-based standards in the dissemination of electrical quantities.
Gerald FitzPatrick , Applied Electrical Metrology Group Leader.
AML 215 Bldg, Rm. C103-106. (NIST Contact: Gerald FitzPatrick, 301-975-8922, gerald.fitzpatrick@nist.gov)


2/24/12 1:30 PM - CNST NANOFABRICATION RESEARCH GROUP SEMINAR: Strong Control Through Weak Bonds: New Strategies for Specific Recognition, Self-Organization and Self-Replication in Man-Made Materials
In this lecture, I will focus on the exciting new possibilities that synthetic DNA offers for the creation of self-organizing and self-replicating materials of nano- and micro-particles. DNA 'sticky ends' with complementary nucleotide sequences, for instance, form highly specific and reversible links between the particles. Besides their application in directed self-assembly, I will discuss the intriguing physics and broader implications of such (collections of) weak ligand-receptor-like bonds.
Mirjam Leunissen , Scientific Group Leader/Foundation for Fundamental Research on Matter, AMOLF institute, Utrecht, The Netherlands.
217 Bldg, Rm. H107C. (NIST Contact: J. Alex Liddle, 301-975-6050, james.liddle@nist.gov)



MEETINGS ELSEWHERE



2/6 -- MONDAY

No Scheduled Events

2/7 -- TUESDAY

No Scheduled Events

2/8 -- WEDNESDAY

No Scheduled Events

2/9 -- THURSDAY

No Scheduled Events

2/10 -- FRIDAY

No Scheduled Events

ADVANCE NOTICE

No Scheduled Events

TALKS BY NIST PERSONNEL


CLARK, C. : NIST AND THE NOBEL PRIZE IN CHEMISTRY: DEUTERIUM.
Physical Chemistry Seminar, University of Maryland, College Park, MD, 2/8.

STAFFORD, C. : SURFACE WRINKLING METROLOGY FOR SOFT MATERIALS.
Virginia Tech, Blacksburg, VA, 2/8.

SOLES, C. : NIST AND ITS ROLE IN FACILITATING MANUFACTURING.
Flextech Alliance Meeting, Phoenix, AZ, 2/9.

CLARK, C. : FERDINAND BRICKWEDDE AND THE DISCOVERY AND EXPLOITATION OF DEUTERIUM.
Brickwedde Lecture, Department of Physics and Astronomy, Johns Hopkins University, Baltimore, MD, 2/9.

DELONGCHAMP, D. : MATERIALS STRUCTURE MEASUREMENTS FOR FLEXIBLE ELECTRONICS.
Flextech Annual Meeting, Phoenix, AZ, 2/9.



ANNOUNCEMENTS


CALL FOR 2012 NIST PORTRAIT GALLERY NOMINATIONS
CALL FOR 2012 NOMINATIONS NIST GALLERY OF DISTINGUISHED SCIENTISTS, ENGINEERS AND ADMINISTRATORS The NIST Portrait Gallery of Distinguished Scientists, Engineers and Administrators honors NBS/NIST alumni for outstanding career contributions to the work of NBS/NIST. Portraits and biographies of those selected are displayed in the corridor of the NIST cafeteria at Gaithersburg. Portraits of at most ten additional persons will be added to the Portrait Gallery in 2012. Any current or former NIST staff member may make a nomination. Nominations are welcome for alumni who were administrators of either programmatic or support units. For persons who were nominated last year, but not selected, a new nomination may be submitted. If a nominee is not selected after two successive years of nomination, the nominee will not be considered in the following year. Nomination instructions are available from the Standards Alumni Association (SAA), Room A-42 Admin, Mail Stop 0952, NIST, Gaithersburg, MD 20899-0952; telephone 301-975-2486; by email: alumni@nist.gov; or from the SAA website: www.nist.gov/director/saa. Nominations shall be received by the Standards Alumni Association on or before February 10, 2012, by mail or by email to the above addresses. No exceptions will be made to this deadline. December 2011
NIST Contact: Edgar Etz, 301-975-2486, alumni@nist.gov


VISITOR REGISTRATION FOR NIST EVENTS
Because of heightened security at the NIST Gaithersburg site, members of the public who wish to attend meetings, seminars, lectures, etc. must first register in advance. For more information please call or e-mail the "NIST Contact" for the particular event you would like to attend.
NIST Contact: . ., ., .




NIST WEB SITE ANNOUNCEMENTS


No Web Site announcements this week.

For more information, contact Ms. Sharon Hallman, Editor, Stop 2500, National Institute of Standards and Technology, Gaithersburg MD 20899-2500; Telephone: 301-975-TCAL (3570); Fax: 301-926-4431; or Email: tcal@nist.gov.

All lectures and meetings are open unless otherwise stated.

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