NIST Technicalendar October 19 to October 23, 2009 The NIST Technicalendar is issued each Friday. All items MUST be submitted electronically from this web page by 12:00 NOON each Wednesday unless otherwise stated in the NIST Technicalendar. The address for online weekly editions of the NIST Technicalendar and NIST Administrative Calendar is: http://www.nist.gov/tcal.

In this Issue: Meetings at NIST Meetings Elsewhere Announcements Talks by NIST Personnel NIST Web Site Announcements NIST Administrative Calendar (current)   NIST Vacancy Announcements (current)

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No Scheduled Events

10:30 AM - High in Sodium: Spectroscopy of the D-lines at Z=72-79
10:30 AM - Cell and Tissue Quantification with Applications to Genomic Analysis of Breast Cancer
10:30 AM - Tuning the Activity of Platinum Electrocatalysts via Size, Shape and Capping Polymer
1:30 PM - Structure Development in Drying Coatings
3:30 PM - Fabrication and Characterization of Compositionally-Graded Shape Memory Alloy Films
4:15 PM - Fracture and adhesion of ceramics, glasses, and thin films

No Scheduled Events

10:00 AM - CSTL Colloquium: Scientific Challenges of Transitioning Well-Characterized Biologics from Activity-based to Mass-balance Units
11:00 AM - Gene Golovchinksy (FXPAL): A Model of Collaborative Search

10:30 AM - Material and Electrical Characterization for Qubit Devices
1:30 PM - Building a Plasmonic Library: Creating Standards for Plasmonic Materials

10/19 -- MONDAY

No Scheduled Events

10/20 -- TUESDAY

10:30 AM - ATOMIC PHYSICS DIVISION SEMINAR: High in Sodium: Spectroscopy of the D-lines at Z=72-79
The D-lines in sodium are among the first spectral lines ever observed, and they remain widely used in science and technology today. We have recently studied their analogs in highly charged Na-like ions of hafnium, tantalum, tungsten, and gold. At such high values of Z, relativistic effects become so large that the "fine structure" splitting is of order unity (i.e., the splitting is larger than the mean energy of the two lines), rather than the one-part-in-a-thousand that it is in neutral sodium. In this talk, I will discuss the history and use of the D-lines, our experiment to measure them in trapped highly charged ions, the comparison to ab initio theory, and the application of our work to the development of fusion energy diagnostics.
John Gillaspy , Physicist, Atomic Physics Division, NIST.
221 Bldg, Rm. B145. (NIST Contact: Gail Newrock, 301-975-3200, gail.newrock@nist.gov)

10:30 AM - OPTICAL TECHNOLOGY DIVISION SEMINAR: Cell and Tissue Quantification with Applications to Genomic Analysis of Breast Cancer
Stephen Lockett , Biophysicist.
220 Bldg, Rm. A343. (NIST Contact: Maritoni Litorja, 301-975-8095, maritoni.lortja@nist.gov)

10:30 AM - CNST ENERGY RESEARCH GROUP SEMINAR: Tuning the Activity of Platinum Electrocatalysts via Size, Shape and Capping Polymer
The high cost and the low catalytic activity of the anode catalysts are two major obstacles in the development of the direct-methanol fuel cell. Platinum (Pt)-based catalysts are considered the best anode catalysts for methanol electro-oxidation reaction and their catalytic activity is highly dependent on their surface structure. At nanoscale, the major determinants of the surface structure are the shape and size of the catalyst particles. Hence, this talk will focus on the investigation of the shape and size dependent electro-catalytic activities of Pt nanoparticles. Simple synthetic procedures for the concomitant control of the shape and size of the Pt nanoparticles will be described and the trends in the electro-catalytic activity of the synthesized catalysts will be discussed. The findings of a mechanistic investigation based on surface-enhanced infra-red absorption spectroscopy, detailing the intermediate species generated during the methanol electro-oxidation reaction on these catalysts will be presented. Additionally, this talk will illustrate the first evidence on the enhancing effect of the capping polymer polyvinylpyrrolidone on the activity of Pt nanocatalysts for several electrochemical reactions. The results of this overall investigation will be discussed within the context of the development of potential approaches, in fuel-cell related electro-catalysis research, that combine the effect of shape, size and capping polymer to tune the activity of Pt electro-catalysts.
Ceren Susut , Postdoctoral/Department of Chemistry, Georgetown University.
Bldg.217, Rm.H107. (NIST Contact: Alec Talin, 301-975-4724, albert.talin@nist.gov)

1:30 PM - NIST/INDUSTRY POLYMER SURFACE/INTERFACE CONSORTIUM MEETING: Structure Development in Drying Coatings
Coating processes occur in two main steps: (i) deposition of a liquid (e.g., solution, dispersion) onto a substrate and (ii) solidification of the liquid layer, typically by drying or curing, into a functional coating. Understanding the tremendous changes in properties and structure that occur dynamically during drying is typically critical to designing formulations and process conditions, but capturing these changes requires special techniques. In this talk, two of these special techniques will be discussed: cryoSEM and microrheology. Cryogenic SEM (cryo-SEM) is an ideal tool for capturing the stages of microstructure development during drying. The method involves freezing coatings at different stages of drying, fracturing to reveal cross-sections, subliming for contrast and imaging with an SEM equipped with a cryostage. An example application of cryoSEM in a study of the relative effects of evaporation, diffusion, and sedimentation on structure development in particulate coatings will be presented. Magnetic microrheology has been developed as a tool to characterize the viscosity of a coating in situ. A small quantity of magnetic particles is added to the coating liquid, which is then deposited onto a substrate and mounted in a specially designed apparatus. A magnetic field is applied and the velocity of the particles is then monitored with an optical microscope. The method is capable of measuring the viscosity as a function of position in the coating and time during drying or curing. An example application of the method to study the viscosity increase in an aqueous-based coating during drying will be presented along with the connection between rheology and the sagging characteristics of the coating.
Lorraine Francis , Professor, Dept. of Chemical Engineering & Materials Science, University of Minnesota, Minneapolis, MN, lfrancis@umn.edu.
226 Bldg, Rm. B221. (NIST Contact: Li-Piin Sung, 301-975-6737, lipiin@nist.gov)

3:30 PM - NIST/INDUSTRY POLYMER SURFACE/INTERFACE CONSORTIUM MEETING: Fabrication and Characterization of Compositionally-Graded Shape Memory Alloy Films
The miniaturization of engineering devices has created interest in new actuation methods capable of high power and high frequency responses. Shape memory alloy (SMA) thin films have exhibited one of the highest power densities of any material used in these actuation schemes. However, they currently require complex thermomechanical training in order to be actuated, which becomes more difficult as devices approach the microscale. Previous studies have indicated that SMA films with compositional gradients have the added feature of an intrinsic two-way shape memory effect (SME). In this work, a new method for processing and characterizing compositionally-graded transformable thin films is presented. Graded NiTi SMA films were processed using magnetron sputtering and a diffusion modification technique. The films were characterized using a combination of atomic force microscopy (AFM), x-ray diffraction and Auger electron spectroscopy. The compositional gradient was indirectly characterized by measuring the variation in mechanical properties as a function of depth via nanoindentation. The similarity of the indentation response on films of varying thickness was used to estimate the width of the graded interface. The nanoindentation response was predicted using an analysis that accounted for the transformation effects occurring under the tip during loading and the variation of elastic modulus resulting from the gradient. The recovery mechanisms of the graded films are compared with homogeneous films using AFM with in situ heating and cooling. The graded films exhibited a two-way SME with a reduced hysteresis, while the homogeneous films exhibited the classical one-way SME. The fabrication and characterization techniques developed in this work have the potential to be applied to general graded and multi-layer film systems.
Daniel Cole , Department of Mechanical Engineering, Univ. of Maryland.
226 Bldg, Rm. B221. (NIST Contact: Li-Piin Sung, 301-975-6737, lipiin@nist.gov)

4:15 PM - NIST/INDUSTRY POLYMER SURFACE/INTERFACE CONSORTIUM MEETING: Fracture and adhesion of ceramics, glasses, and thin films
Indentation is frequently used as a local probe of elastic, plastic, and viscous behavior. Fracture (cohesive and adhesive) may also be studied with indentation techniques. This talk will give an overview of indentation fracture mechanics and describe some specific examples including applications and observations in ceramics, glasses and fracture of thin films.
Dylan Morris , Ceramics Division, NIST, Gaithersburg, MD.
226 Bldg, Rm. B221. (NIST Contact: Li-Piin Sung, 301-975-6737, lipiin@nist.gov)


10/21 -- WEDNESDAY

No Scheduled Events

10/22 -- THURSDAY

10:00 AM - CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY OFFICE SEMINAR: CSTL Colloquium: Scientific Challenges of Transitioning Well-Characterized Biologics from Activity-based to Mass-balance Units
The potency of a biopharmaceutical is an attribute that is challenging to measure. There are various units of measure (e.g., International Units, USP units) used to describe the potency of a biopharmaceutical. Recently, some metrological agencies have begun exploring whether a new unit of measure could be developed as a SI unit to describe biopharmaceutical potency. The diversity of biopharmaceuticals, both naturally occurring and engineered, make establishing one SI unit for potency difficult. It is generally accepted that to have a SI unit for potency requires a physicochemical method of analysis to use as a reference method. Variants of biopharmaceuticals can arise from degradation, misincorporation, conjugation (e.g., pegylation), and other mechanisms make it increasingly difficult to establish a physicochemical method(s) of analysis to describe the potency of a biopharmaceutical. The diversity of biopharmaceutical molecules, their heterogeneous forms, and analytical challenges associated with physicochemical analysis will be discussed.
Dr. Wesley Workman, Associate Research Fellow/Team Leader , Technical Svs., Site Support, St. Louis Biopharma Quality Organization, Pfizer Global Manufacturing, Chesterfield, MO.
Bldg 227, Rm. A302. (NIST Contact: Mike Amos, 301-975-8631, mamos@nist.gov)

11:00 AM - INFORMATION ACCESS DIVISION SEMINAR: Gene Golovchinksy (FXPAL): A Model of Collaborative Search
Gene Golovchinsky , Senior Research Scientist, FX Palo Alto Laboratory.
215-AML Bldg, Rm. C103-106. (NIST Contact: Ian Soboroff, 301-975-3987, ian.soboroff@nist.gov)


10/23 -- FRIDAY

10:30 AM - ATOMIC PHYSICS DIVISION SEMINAR: Material and Electrical Characterization for Qubit Devices
Silicon Quantum Dot fabrication for Qubits requires a minimum of defects to produce clean quantum dots and barriers. Identifying sources of defects in the process flow is critical for this goal. We can both i) characterize oxide quality with C-V and mobility measurements to improve fabrication processes, and ii) provide quantitative estimates of the defects, which provides guidance to design and modeling efforts. In this presentation, we report on the impact of several critical process steps, including poly-Si etch, top gate metallization, atomic layer deposition of dielectrics, and various anneals.
Greg Ten Eyck , Sandia National Labs.
Physics Building, Room B145. (NIST Contact: Neil Zimmerman, 301-975-5887, neil.zimmerman@nist.gov)

1:30 PM - POLYMERS DIVISION SEMINAR: Building a Plasmonic Library: Creating Standards for Plasmonic Materials
Surface plasmons are responsible for a variety of phenomena including nanoscale optical focusing, negative refraction, and surface enhanced Raman scattering. Their characteristic evanescent electromagnetic fields offer numerous opportunities for sub-diffraction imaging, optical cloaking, and label-free molecular sensing. The selection of materials for applications, however, has been traditionally limited to the noble metals Au and Ag because there has been no side-by-side comparison of other materials. This talk will describe our recent progress on manipulating surface plasmons from ultraviolet to near-infrared wavelengths using plasmonic crystals made from 2D nanopyramidal arrays. A library of plasmon resonances was constructed in the form of dispersion diagrams for a series of unconventional and new composite plasmonic materials. These resonances could be tuned by controlling both intrinsic factors (unit cell shape, materials type) as well as extrinsic factors (excitation conditions, dielectric environment). Finally, we will discuss prospects for generating plasmonic crystals with reduced lattice symmetries as a means to achieve broadband coupling.
Teri Odom , Northwestern University.
224 Bldg, Rm. A312. (NIST Contact: Chris Soles, 301-975-8087, csoles@nist.gov)


ADVANCE NOTICE

10/27/09 2:00 PM - CNST NANOFABRICATION RESEARCH GROUP SEMINAR: Model-based white light interference microscopy for metrology of transparent film stacks and optically-unresolved structures
White light interferometry has evolved from a high-precision tool for 3D surface-topography to a multi-functional platform for surface structure analysis. The drivers for this evolution are the increased complexity and shrinking feature size of high-volume production components such as semiconductor wafers, flat panel displays, data storage components and MEMS. The enabling technology is interferometry combined with advanced computer analysis, including detailed instrument modeling, complex reflectivity analysis for transparent films and rigorous coupled wave analysis (RCWA) for optically-unresolved features. I present here the principles and several practical examples of measurements of multi-layer dielectric and metallic film stacks and shape parameters for surface features smaller than 50nm wide using visible-wavelength interferometry. I also show how these data may be combined with 3D surface topography for a complete surface structure analysis.
Peter de Groot , Director, Research & Development, Zygo Corp, Middlefield, CT. Xavier Colonna de Lega , Senior Research Scientist. Zygo Corp., Middlefield, CT.
BLDG. 217, RM. H107. (NIST Contact: Gregg Gallatin, 301-975-2140, gregg.gallatin@nist.gov)

10/28/09 2:00 PM - CIVIL RIGHTS AND DIVERSITY DIVISION SEMINAR: Making Workplace Accommodations with the help of JAN
JAN provides free consulting services for federal employers, including one-on-one consultation about all aspects of job accommodations, compliance assistance with section 501 of the Rehabilitation Act, information about federal initiatives and hiring programs, and referral to federal resources.
Anne Hirsh , Director of JAN.
Administration Bldg, Lecture Rm. D. (NIST Contact: Jeremy Lawson, 301-975-9578, jeremy.lawson@nist.gov) http://www.jan.wvu.edu/empl/index.htm#fed
Special Assistance Available

10/30/09 10:30 AM - CERAMICS DIVISION SEMINAR: Micromechanical Principles in Sintering And It's Verification By Using MEMS-Inspired Experimental Method
The macroscopic shrinkage in sintering results from microscopic particle motions that are driven by the sum of the external force and the internal thermodynamic driving force, i.e., the sintering force. A particle interacts with its neighbor particles at grain boundaries, and the relative motion between two particles is a superposition of translation and rotation, which is driven by the torque induced by the orientation dependence of grain boundary energy. We are developing an experimental technique for the sintering of sintering of two microscale particles using focused ion beam machining. The evolution of the sintering couples in thin Au foils after different annealing times gives information about the sintering force and the torque, then, we can evaluate the grain boundary energy and the grain boundary diffusion coefficient of various types of grain boundaries. This knowledge will be useful to predict the anisotropic shrinkage, because the macroscopic shrinkage of a component is influenced by anisotropy in both surface energy and grain boundary diffusion coefficient, when the crystalline orientation distribution is anisotropic.
Fumihiro Wakai , Tokyo Institute of Technology.
Materials Bldg, Rm. A250. (NIST Contact: Sheldon Wiederhorn, 301-975-5772, sheldon.wiederhorn@nist.gov)

10/30/09 10:30 AM - NIST COLLOQUIUM SERIES: Innovations in Semiconductor Devices for Exascale Computing
The continuous scaling of CMOS device technology has enabled system performance to double every two years for the past 40 years. However, emerging classes of applications for which network-speed processing and data-intensive modeling are integral components will demand a much faster rate of improvement, such as 2x/year in order to reach exaflop capabilities (100x-1000x over present systems) by the end of the next decade. These applications require continued innovation to increase intrinsic transistor performance/power and density. New system architectures will take advantage of 3D chip technology to enable a higher level of hybrid integration, new memory technology such as Phase Change Memory (PCM) will allow implementation of a new level of memory architecture, and silicon photonics on the processor will meet ultra-low power, low cost and high density communications needs. These and other innovations will lead to significant improvement in systems integration, performance, and power efficiency.
Tze-chiang (T.C.) Chen , IBM Fellow and Vice President of Science & Technology, IBM Watson Research Center, Yorktown Heights.
Administration Building, Green Auditorium. (NIST Contact: Kum Ham, 301-975-4203, kham@nist.gov)
Special Assistance Available

10/30/09 2:00 PM - CENTER FOR NANOSCALE SCIENCE AND TECHNOLOGY SEMINAR: CNST Nanofabrication Research Group Seminar
The ongoing quest for semiconductor lasers with low threshold current has led to the development of new materials (e.g., quantum wires and dots) and new optical resonators (e.g., microdisks and photonic bandgap crystals). In a novel approach to ``thresholdless" lasers, we have developed a new growth technique for self-assembled deep-centers in the technologically important semiconductor gallium-arsenide. We recently demonstrated the first gallium-arsenide deep-center laser. These lasers, which intentionally utilize gallium-arsenide deep-center transitions, exhibited a threshold current density of less than 2A/cm2 with electrical injection in continuous-wave mode at room temperature at the important 1.54um fiber-optic wavelength. Moreover, in contrast to conventional semiconductor devices, whose operating wavelengths are fixed by the bandgap energy, the room-temperature stimulated-emission from gallium-arsenide deep-centers can be tuned very widely from the bandgap (about 900nm) to half-the-bandgap (1600nm). We demonstrated laser action at many wavelengths between 1.2um and 1.6um, which includes fiber-optic wavelengths. We explain the physics of gallium-arsenide deep-center lasers. Biography: At Yale University, Dr. Janet Pan has been a winner of the NSF Career, ONR Young Investigator, and Sheffield Teaching Awards. Dr. Pan has been an Invited Speaker at the March Meeting of the APS, the International Conference on the Physics of Semiconductors, and Photonics West. Dr.Pan received all her degrees from the Massachusetts Institute of Technology. While at MIT, she won the Hertz, NSF, and Rockwell International Graduate Student Fellowships. She was also a winner of the Associate of MIT Alumnae Highest Academic Achievement Award for best female undergraduate student.
Janet Pan , Associate Professor and Research Scientist, Yale University.
Bldg.217, Rm.H107. (NIST Contact: Kartik Srinivasan, 301-975-5938, kartik.srinivasan@nist.gov)

11/5/09 9:00 AM - OFFICE OF SECURITY: Counterintelligence; Indicators of Espionage 2009-2010
November 5, 2009, 9:00 a.m. - 10:00 a.m. Advanced registration requested OSY@NIST.GOV. Walk-ins welcome.
Michael Chandler , Office of the Chief Facilities Management.
Administration Building, Green Auditorium. (NIST Contact: Michael Chandler, 301-975-3305, michael.chandler@nist.gov)

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MEETINGS ELSEWHERE


10/19 -- MONDAY

11:00 AM - CARNEGIE INSTITUTION OF WASHINGTON/GEOPHYSICAL LAB. SEMINAR: TBA
J. Armstrong , Carnegie Institution for Science.
Bldg, Rm..
Greenewalt Bldg., GL-DTM Grounds, Carnegie Institution of Washington, DC. (NIST Contact: Doug Rumble, 202-478-8900, seminar@lists.ciw.edu)



10/20 -- TUESDAY

4:00 PM - NOBELIST PHILIP ANDERSON TO GIVE INAUGURAL PRANGE PRIZE LECTURE AT UMD
Pioneering theorist and Nobel laureate Philip W. Anderson has been named the first recipient of the Richard E. Prange Prize and Lectureship in Condensed Matter Theory and Related Areas. Anderson will deliver a public presentation at the University of Maryland, College Park on Oct. 20, 2009. The annual award, newly established by the UMD Department of Physics and Condensed Matter Theory Center (CMTC), honors the late Professor Richard Prange, whose distinguished career at Maryland spanned four decades (1961-2000). The Prange Prize is made possible by a gift from Dr. Prange's widow, Dr. Madeleine Joullié of the University of Pennsylvania.Anderson's lecture, titled "Presenting Unpopular Theories," will be delivered at the University of Maryland's John Toll Physics Building at 4:00 p.m. EDT on Tuesday, Oct. 20 in the Physics Lecture Hall, Room 1412. The event is open to the public.
Philip Anderson , Joseph Henry Professor of Physics at Princeton University, Princeton, NJ.
Bldg, Rm..
Rm. 1412, Physics Lecture Hall, John Toll Physics Building, University of Maryland. (NIST Contact: Nick Hammer, 301-405-5946, phys-chair@umd.edu) http://umdphysics.umd.edu/index.php/events/article/344%20.html



10/21 -- WEDNESDAY

No Scheduled Events

10/22 -- THURSDAY

No Scheduled Events

10/23 -- FRIDAY

No Scheduled Events

ADVANCE NOTICE

No Scheduled Events

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TALKS BY NIST PERSONNEL

HIGHT WALKER, A. : TECHNICAL SPECIFICATION FOR THE USE OF RAMAN SPECTROSCOPY IN THE CHARACTERIZATION OF SINGLE-WALL CARBON NANOTUBES.
ISO (International Organization for Standardization), Intercontinental David, Tel Aviv Israel, 10/19.

CHAKA, A. : PREDICTING THE IMPACT OF THE ENVIRONMENT ON THE STRUCTURE AND CHEMISTRY OF METAL OXIDE SURFACES: THE ROLE OF ELECTRONIC STRUCTURE.
Geological Society of America, Convention Center, Portland Orgeon, 10/19.

POWELL, C. : EFFECTS OF ELASTIC SCATTERING AND ANALYZER ACCEPTANCE ANGLE ON THE ANALYSIS OF ANGLE-RESOLVED X-RAY PHOTOELECTRON SPECTROSCOPY DATA.
13th European Conference on applications of Surface and Interface Analysis, Antalya, Turkey, 10/19.

MASON, S. : CHARACTERIZATION OF PB(II) ADSORPTION ON HYDRATED MINERAL SURFACES THROUGH ELECTRONIC STRUCTURE CALCULATIONS.
Geological Society of America, Convention Center, Portland Oregon, 10/19.

MICHAELS, C. : CHEMICAL IMAGING WITH RAMAN MICROSCOPY.
Federation of Analytical Chemistry & Spectroscopy Societies Annual Meeting, Louisville, KY, 10/20.

RICHTER, C. : NANOELECTRONIC DEVICES AND MEASUREMENT SCIENCE.
The University of Washington, Seattle, Washington, 10/20.

GILLEN, G. : MEASUREMENTS & STANDARDS FOR TRACE EXPLOSIVES DETECTION.
Explosives Detection 2009 Symposium and Workshop, San Diego, CA, 10/20.

MESSINA, J. : DRIVERS FOR ENVIRONMENTAL INFORMATION EXCHANGE.
ISMI Symposium, Austin TX USA, 10/21.

HUNT, F. : MEASURING THE UTILITY/PATH DIVERSITY TRADEOFF IN MULTIPATH PROTOCOLS.
Fourth International Conference on Performance Evaluation Methodologies and Tools (Valuetools 2009), Pisa, Italy, 10/21.

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ANNOUNCEMENTS

VISITOR REGISTRATION FOR NIST EVENTS
Because of heightened security at the NIST Gaithersburg site, members of the public who wish to attend meetings, seminars, lectures, etc. must first register in advance. For more information please call or e-mail the "NIST Contact" for the particular event you would like to attend.
NIST Contact: . ., ., .

DIVERSITY DAY 4: GENERATIONAL DIVERSITY
Diversity Day 4: Generational Diversity with Robert Wendover Tuesday, November 10, 2009 This event will feature a keynote seminar and staff panel discussion in the morning. Smaller seminars for senior and line management will continue in the afternoon. The schedule is as follows: 9-10 a.m. ET: Generational Diversity Panel Discussion 10:30-11:45 a.m. Red Auditorium Keynote: Managing Age Diversity in Today's Workplace How does a "fifty-something" lead a "twenty-something?" How does a "twenty-something" lead a "fifty-something?" To thrive in this new world, you must understand the values and attitudes of both new and experienced workers. This talk helps you take a realistic, yet amusing look at how the generations relate. 12:30 p.m. Senior Leaders Lunch Session: Succession Planning and the New Generations As Baby Boomers edge closer to retirement, they are being replaced by a cohort of people having a radically different take on leadership. Younger generations will challenge the traditional ways that organizations promote and develop leaders. This a unique program focused on how your enterprise can ensure tomorrow's success by integrating the aspirations of young workers with the wisdom of veteran managers. 2 p.m. – 3:30 p.m. Division Chiefs and Group Leaders Green Auditorium Been There, Done That! Best Practices in Managing Age Diversity Age differences in today's workplace have become a major challenge for supervisors young and old. Veteran managers think young people lack initiative and common sense. Young workers think older employees are stuck in their ways. Young people depend upon technology. Older workers depend upon their experience. This will help you connect with the needs and desires of the diverse generations in your workplace and learn how managers in your industry and others are not just surviving, but thriving with the young talent entering the workforce.
NIST Contact: Jeremy Lawson, 301-975-5481, jeremy.lawson@nist.gov

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NIST WEB SITE ANNOUNCEMENTS

No Web Site announcements this week.

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For more information, contact Ms. Sharon Hallman, Editor, Stop 2500, National Institute of Standards and Technology, Gaithersburg MD 20899-2500; Telephone: 301-975-TCAL (3570); Fax: 301-926-4431; or Email: tcal@nist.gov.

All lectures and meetings are open unless otherwise stated.

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