NIST Technicalendar July 27 to July 31, 2009 The NIST Technicalendar is issued each Friday. All items MUST be submitted electronically from this web page by 12:00 NOON each Wednesday unless otherwise stated in the NIST Technicalendar. The address for online weekly editions of the NIST Technicalendar and NIST Administrative Calendar is: http://www.nist.gov/tcal.

In this Issue: Meetings at NIST Meetings Elsewhere Announcements Talks by NIST Personnel NIST Web Site Announcements NIST Administrative Calendar (current)   NIST Vacancy Announcements (current)

Also available: Previous Issues of the Technicalendar Quick Technicalendar (current) Last week's Quick Technicalendar Last week's Technicalendar Detailed Search NIST Journal of Research (Current TOC) Change User Options

No Scheduled Events

10:30 AM - Precision X-Ray Spectroscopy of Highly-Charged Ions From Low-Energy Ion Sources
10:45 AM - Present Status on Development of Neutron Radiography Techniques for Fuel Cell Researches in Kobe University

11:00 AM - Six Impossible Things Before Breakfast: Assigning Key Comparison Reference Values in Chemical Measurement

10:00 AM - An Upbeat Legal View of Invention, Patenting, Extramural Collaboration, and Technology Transfer From the Desk of NIST Chief Counsel Henry Wixon
10:30 AM - 1/f Noise Characterization of n- and p-type Polycrystalline Silicon Thin Film Transistors
11:00 AM - Spreadsheets and Good Statistics: A Tale of Love and Hatred

10:30 AM - International Equivalence of Chemical Measurement Standards- the BIPM Programme
2:00 PM - Standards and Scales for the Monitoring of Global Greenhouse Gases and other Trace Species
2:00 PM - NanoFab Users Meeting

7/27 -- MONDAY

No Scheduled Events

7/28 -- TUESDAY

10:30 AM - ATOMIC PHYSICS DIVISION SEMINAR: Precision X-Ray Spectroscopy of Highly-Charged Ions From Low-Energy Ion Sources
Spectroscopy of highly-charged ions has been used for 3 decades to test QED in strong electromagnetic fields. It also has applications to plasma physics. Experiments evolved in two parallel lines: - beam-foil spectroscopy, with large Doppler shift and broadening-dominated uncertainties (~25 ppm at best) to storage ring experiments for very heavy elements with better control of the Doppler effect (using laboratory frame X-ray standards) - spectroscopy based on highly charged ion sources using X-ray reference lines (typically from X-ray tubes) to absolute energy measurements in Heidelberg (using an EBIT) and Paris (using an Electron-Cyclotron Resonance Ion Source) In this talk I will describes recent advances in absolute highly-charged ions X-ray transitions energy measurements, show preliminary results and describe difficulties to be overcome to get X-ray measurements of transitions like the 1s2s 3S1- 1s2 1S0 relativistic M1 transition in heliumlike Ar or the 1s 2s 2p 2PJ-1s2 2s 2S1/2 transition in lithiumlike Ar using a double-flat crystal spectrometer.
Paul Indelicato , Director, Laboratoire Kastler Brossel.
Physics Building, Room B145. (NIST Contact: Peter Mohr, 301-975-3217, mohr@nist.gov)

10:45 AM - NIST CENTER FOR NEUTRON RESEARCH SEMINAR: Present Status on Development of Neutron Radiography Techniques for Fuel Cell Researches in Kobe University
Development of neutron radiography techniques for fuel cell researches have been carried out by JAEA and Kobe University as a project of New Energy and Industrial Technology Developing Organization ( NEDO ). Visualization techniques for three type fuel cells, an A4-size cell for automobiles, a Japan Automobile Research Institute ( JARI ) standard cell and stack ( 50x50 mm2 in MEA area ) and a small cell ( 5~10 mm in MEA width ) for the visualization of MEA and GDL. Experimental techniques for dynamic CT, micro CT and quantitative measurement of water thickness have been developing in Kobe University. The present status of the development will be shown in this presentation.
Nobuyuki Takenaka , Kobe University,.
235 Bldg, Rm. E100. (NIST Contact: Daniel Hussey, 301-975-6465, daniel.hussey@nist.gov)


7/29 -- WEDNESDAY

11:00 AM - STATISTICAL ENGINEERING DIVISION SEMINAR: Six Impossible Things Before Breakfast: Assigning Key Comparison Reference Values in Chemical Measurement
CCQM, the CIPM Consultative Committee for Quantity of Material, coordinates comparisons between National Measurement Institutes and Designated Institutes in the field of chamical and biological measurement. These comparisons cover a range of different problems, from the preparation and analysis of primary gas standards to the measurement of trace organic substances in complex food, biological and environmental matrices. Like many other CIPM comparisons, the basic principle involves circulation of a material or test item, collation of results from laboratories, assignment of a Key Comparison Reference value and assessment of laboratory performance in terms of their deviation from that KCRV. In the longer terms, this performance is relevant to the declaration of Calibration and Measurement Capabilities listed in the CMC database maintained by BIPM. Some of these studies, particularly those in the gas metrology area, are very similar to intercomparisons of primary standards in other fields, and are based on a long history of measurements of similar substances in familiar and sometimes very simple matrices. These studies typically generate data in which the majority of labs agree very well and in which the uncertainties reported by the participants fully account for the observed dispersion. In most other cases, however, the range of materials to determine and the number of different matrices in which they must be measured is wide; unexpected problems arise and may disproportionately affect a significant fraction of participant results. Although agreement remains very good compared to routine measurements, there is often evidence of unexpected deviation for a particular lab or of some underestimation of uncertainty. These issues can make the assignment of a key Comparison reference value (KCRV) surprisingly contentious. Against this background, CCQM has historically used a wide variety of treatments for KC and Pilot Comparison data, and is currently seeking to harmonise its approach to KCRV assignment, estimation of KCRV uncertainty and estimation of degrees of equivalence and their respective uncertainties. In 2008, a set of general principles were proposed [1]. Since then, a CCQM ad-hoc working group has been attempting to implement these principles in guidance aimed at KC and Pilot study coordinators intending to provide a KCRV based on a consensus of laboratory results. This presentation will review the proposed CCQM principles and some typical data sets, and describe a possible framework for putting the principles into practice. This framework relies on identifying the nature and scale of deviations from ideal behaviour and tailoring the data treatment to suit the actual problems presented by the data. It will be shown that even this adaptive approach presents considerable difficulties, some arising from the small size of the data set and some from the often competing desires for formal rigour, statistically valid treatment, simplicity and appropriate differentiation of measurement capabilities among laboratories. Finally, some options for assessing Key Comparison data in the absence of a reliable KCRV will be suggested, perhaps offering alternative ways of evaluating laboratory agreement when an independent, traceable KCRV is not available. 1.M Cox (2008) Data Evaluation Principles for CCQM Key Comparisons. CCQM reference CCQM-08-08
Stephen L R Ellison , LGC Limited, Queens Road, Teddington, Middlesex.
Building 222, Rm. A326. (NIST Contact: Antonio Possolo, 301-975-2853, antonio.possolo@nist.gov)


7/30 -- THURSDAY

10:00 AM - OTP TECHNOLOGY TRANSFER SEMINAR SERIES: An Upbeat Legal View of Invention, Patenting, Extramural Collaboration, and Technology Transfer From the Desk of NIST Chief Counsel Henry Wixon
Office of Technology Partnerships(OTP) Technology Transfer Seminar Series
Henry Wixon , NIST Chief Counsel, Gaithersburg, MD, henry.wixon@nist.gov.
Administration Building, Green Auditorium. (NIST Contact: Dr. Jack E. Pevenstein, 301-975-5519, jack.pevenstein@nist.gov)
Special Assistance Available

10:30 AM - CNST ENERGY RESEARCH GROUP SEMINAR: 1/f Noise Characterization of n- and p-type Polycrystalline Silicon Thin Film Transistors
Polycrystalline silicon has drawn attention from researchers due to its higher mobilities compared to amorphous silicon (a-Si), which is currently used in the majority of thin film transistor (TFT) sensor arrays. Higher mobilities of poly-Si TFTs allow faster switching and higher transistor drive capabilities compared with a-Si TFTs, enabling build of more complex sensor arrays with smaller pixel sizes while maintaining sufficient gain. A limiting factor in the performance of TFT sensor arrays is the high level of 1/f noise from individual transistors incorporated in each pixel. This talk will discuss the low frequency noise behavior of poly-Si TFTs. Several factors contribute to the noise characteristics of these devices, including carrier number, trap density, and strong coulomb interactions. The data is compared to existing models that provide a theoretical framework for these observations.
Mahdokht Behravan , Post Doctorial Candidate.
Bldg. 215, Rm. C103-106. (NIST Contact: Fred Sharifi, 301-975-4633, fred.sharifi@nist.gov)

11:00 AM - STATISTICAL ENGINEERING DIVISION SEMINAR: Spreadsheets and Good Statistics: A Tale of Love and Hatred
When statistical rigor and common practice meet, paradigms clash. Statistical computing, the use of spreadsheets, and in particular the use of Microsoft Office Excel, frequently arouse disagreement for the sake of correctness on the one side and ease of use on the other. On the one hand, spreadsheets can be credited with giving the masses the ability to store, analyze, visualize, and even model data. I believe that a very large majority of all statistical work carried out in the world, and in particular in industry, is done exclusively using spreadsheets, most of it in Excel. The reason for this popularity is that they provide intuitive, flexible, and comprehensive ways for arranging data, looking at them, performing calculations, building interfaces for day-to-day use, and even for distributing applications within a company or organization. On the other hand, it is well-known that many spreadsheets and in particular Excel have numerical flaws which render them unacceptable to statisticians concerned with numerical correctness and statistical rigor. Moreover, the way spreadsheets are constructed and used leads towards data analytic 'video gaming' and does not provide a foundation for reproducible research. This talk is about reconciling the world of good statistics with the use of spreadsheets. It starts with a reminder of what any practicing statistician should know about the spreadsheet paradigm (automatic recalculation, tabulation of expressions, cross tabulation, optimization, and integrated interface design). It then continues by describing a way of extending the ability of Excel to carry out 'good' statistical computations by adding a bridge to the R language. Statisticians need not hate spreadsheets as long as they know how to use what's good and how to avoid what's bad. I argue that statisticians should even learn to love spreadsheets for their unique potential for giving statistical power to the people.
Christian Ritter , Institut de Statistique, Universit Catholique de Louvain, Belgium.
Building 222, Rm. A326. (NIST Contact: Charles Hagwood, 301-975-2846, hagwood@nist.gov)


7/31 -- FRIDAY

10:30 AM - CHEMICAL SCIENCE AND TECHNICAL LABORATORY SEMINAR: International Equivalence of Chemical Measurement Standards- the BIPM Programme
The Chemistry Program at the International Bureau of Weights and Measures (BIPM) has specialized in the organization comparisons for the demonstration of the international equivalence of standards for air quality and climate change monitoring and pure organic calibrators for clinical chemistry, food analysis and environmental applications. In the last four year period, BIPM coordinated comparisons, have attracted over 124 participations from National Metrology Institutes (NMIs). Coordinated comparisons have included: Ozone-ambient level (CCQM-P28 and BIPM.QM-K1); Nitrogen monoxide (CCQM-P73); Nitrogen dioxide (CCQM-K74, P-110); Theophylline purity (CCQM-P20.e); Digoxin purity (CCQM-P20.f); Estradiol Purity (CCQM-K55.a,P-117.a). The results and points of interest from these comparisons will be discussed, notably: • Improvements in ground-level ozone reference standard to the levels required for ground truthing of satellite measurements; • Requirements and progress in the measurement of ozone absorption cross-sections; • Quantification of infra-red active gases using FTIR and synthetic spectra with traceability to reference data; • The use of general least squares regression for the comparison of measurement standards; • The use of asymmetric uncertainties for reporting measurement results; • Systematic errors in water and solvent quantification in organic materials; • Systematic errors from dimer formation during HPLC analysis; • Development of LC-MSn methods with electrospray ionization for the quantification of cardiac glycosides. Additionally, future plans for comparisons will be discussed as well as a commissioned study on 'Measurement Service and Comparison Needs for an International Measurement Infrastructure for the Biosciences and Biotechnology'.
Robert Wielgosz , Head of Chemistry Section, BIPM, Paris, France, rwielgosz@bipm.org.
Administration Bldg, Lecture Rm. A. (NIST Contact: Karen Startsman, 301-975-8300, karen.startsman@nist.gov)

2:00 PM - CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY OFFICE SEMINAR: Standards and Scales for the Monitoring of Global Greenhouse Gases and other Trace Species
Global datasets for the evaluation of long-term trends for greenhouse gases and other atmospheric species have been obtained through the WMO's Global Atmosphere Watch (GAW) programme. Close collaboration between the BIPM-CCQM Gas Analysis Working Group and the GAW has developed over the years, including BIPM and NMI participation in GAW 2001, 2005 and 2009 meetings. The gas species of interest to WMO-GAW will be reviewed including the processes currently in place for establishing traceability to primary standards maintained by designated WMO-GAW Central Calibration Laboratories (CCLs). In general, the CCLs are not National Metrology Institutes, and traceability is established to a specific set of primary standards which define the WMO Scale for that gas species, examples include CO2, CH4 and N2O. The consistency of standards comprising the WMO scale with standards with SI traceable values will be examined by reviewing the outcomes of CCQM comparisons (CCQM-P41 and CCQM-K68). The propagation of uncertainty in the traceability chain for WMO-GAW measurements will also be analysed. Finally, recent initiatives by NMIs to move towards establishing CCLs for WMO-GAW for reactive gases, notably for selected VOCs and NOx gases will be explained and future or unmet requirements for primary standards will also be described.
Robert Wielgosz , Head of Chemistry Section, BIPM, Paris, France, rwielgosz@bipm.org.
Administration Bldg, Lecture Rm. A. (NIST Contact: Karen Startsman, 301-975-8300, karen.startsman@nist.gov)

2:00 PM - CNST NANOFAB SEMINAR: NanoFab Users Meeting
Agenda Items will include: • Update on new tool installation • Discussion of new tools desired • Last meeting's action items • Research Participant growth rate stats • Improved safety rules • Outreach efforts • NanoFab User Committee There will be prizes, open discussions and a surprise guest!
Vincent Luciani , NanoFab Group Leader.
Building 215, Room C106. (NIST Contact: Vincent Luciani, 301-975-2886, vincent.luciani@nist.gov)


ADVANCE NOTICE

8/3/09 1:30 PM - CNST NANOFAB SEMINAR: Combined Scanning Probe Microscopy and Micro/Nano Raman studies of modern Nanostructures
We will demonstrate various applications of confocal Raman/fluorescence microscope integrated with Atomic Force Microscope (AFM) to investigate modern nanostructures. First, we report on "classical" applications of such combination, when 2D AFM and confocal Raman maps are acquired simultaneously from the same part of the sample, but "independently" one from another. Physical characterization and modification capabilities of AFM merge with chemical resolution of confocal Raman microscope and general capabilities of optical microscope to provide complete information about sample investigated. Diffraction limited resolution of 2D Raman maps is 200 nm. We demonstrate results on various promising nanoelectronics materials: grapheme flakes, carbon nanotubes, semiconductor nanowires etc. The ultimate goal of integrating AFM with Raman/fluorescence spectroscopy is to break diffraction limit and to bring spatial resolution of optical methods down to resolution of AFM (a few nm). We present results of Tip Enhanced Raman Spectroscopy (TERS) mapping experiments realized using integrated AFM-Raman system. Measurements are realized in two different excitation configurations: Inverted (for transparent samples) and Upright (reflected light configuration, for opaque samples). In both geometries we demonstrate near field Raman enhancement effect due to resonant interaction of light with localized surface plasmon at the apex of a metal AFM probe. Various samples are studied by TERS technique: thin metal oxide layers, fullerenes, strained silicon, carbon nanotubes, and grapheme. Actual plasmonic and near field nature of the Raman enhancement is proven by a number of ways: dependence of the enhancement on the excitation wavelength and polarization, enhancement versus tip-sample distance curves, observation of selective enhancement of Raman signal from thin surface layers of the sample etc. Finally, the ultimate performance of TERS is demonstrated by measuring Raman 2D maps with sub wavelength resolution – determined not by the wavelength of light, but by the localization area of the surface plasmon electromagnetic field.
Pavel Sergeevich Dorozhkin , General manager, Optics & Spectroscopy products. Oleg Gennadievich Butyaev and John Janzer
Bldg. 217, Rm. H107. (NIST Contact: Vincent Luciani, 301-975-2886, vincent.luciani@nist.gov)

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MEETINGS ELSEWHERE


7/27 -- MONDAY

No Scheduled Events

7/28 -- TUESDAY

No Scheduled Events

7/29 -- WEDNESDAY

No Scheduled Events

7/30 -- THURSDAY

No Scheduled Events

7/31 -- FRIDAY

No Scheduled Events

ADVANCE NOTICE

No Scheduled Events

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TALKS BY NIST PERSONNEL

JOHNSON, A. (Co-Author: G.Kline ) : NIST'S NATURAL GAS FLOW CALIBRATION SERVICE (NGFCS) IS NOW OPEN.
2009 Ultrasonic Meter Seminar (CEESI), Estes Park, CO, 6/23.

WIGHT, S. : MODELING AND MEASUREMENTS OF ELECTRON BEAM SCATTERING INTO ADJACENT PARTICLES.
Microscopy & Microanalysis 2009 Meeting, Greater Richmond Convention Center, Richmond, VA, 7/27.

MARINENKO, R. : PROPAGATION OF WDS-EPMA UNCERTAINTIES WITH THE ISO/GUM.
Microscopy & Microanalysis 2009 Meeting, Greater Richmond Convention Center, Richmond, VA, 7/27.

HERZING, A. : THREE-DIMENSIONAL CHEMICAL IMAGING OF ORGANIC PHOTOVOLTAIC BULK-HETEROJUNCTION MATERIALS VIA ENERGY FILTERED TRANSMISSION ELECTRON TOMOGRAPHY.
Microscopy & Microanalysis 2009 Meeting, Greater Richmond Convention Center, Richmond, VA, 7/27.

EMARD, E. : STANDARDS IN TRADE (SIT) WORKSHOP PROGRAM.
NCSL International, San Antonio, TX, USA, 7/27.

MEININGER, A. : NATIONAL CENTER FOR CERTIFICATION AND STANDARDS INFORMATION (NCSCI).
NCSL International, San Antonio, TX, USA, 7/27.

BRUCE, S. : CONFORMITY ASSESSMENT OVERVIEW.
NCSL International, San Antonio, TX, USA, 7/27.

COFFMAN, V. : VALIDATING VIRTUAL POLYCRYSTALS WITH OOF.
10th U.S. National Conference on Computational Mechanics, Columbus, OH, 7/27.

HEMMATI, A. : NANO ANALYSIS OF SILVER NANOPARTICLES IN COMMERCIAL SOCKS.
Microscopy & Microanalysis 2009 Meeting, Greater Richmond Convention Center, Richmond, Va, 7/28.

HOLMES, G. : DEGRADATION OF THE ACTIVE FIBERS IN SOFT BODY ARMOR.
International Conference on Composite Materials, Edinburgh, UK, 7/28.

RITCHIE, N. : USING DTSA-II TO SIMULATE & INTERPRETE SPECTRA FROM K411 PARTICLES.
Microscopy & Microanalysis 2009 Conference, Richmond, VA, 7/28.

ANDERSON, M. : "CHARACTERIZATION OF THIN FILM CUCR2SE4 BY A MODULATED ELEMENTAL REACTANT DEPOSITION".
Microscopy & Microanalysis 2009 Meeting, Greater Richmond Convention Center, Richmond, VA, 7/28.

MITCHELL, W. : A SUMMARY OF HP-ADAPTIVE STRATEGIES.
Berlin hp-Workshop on Implementation Aspects, Berlin, Germany, 7/29.

FONG, J. : ARTIFICIAL INTELLIGENCE (AI) TOOLS FOR DATA ACQUISITION AND PROBABILITY RISK ANALYSIS OF NUCLEAR PIPING FAILURE DATABASES.
American Society of Mechanical Engineers (ASME) 2009 Pressure Vessels and Piping Division (PVPD) International Conference, Prague, Czech Republic, 7/30.

RITCHIE, N. : INTRODUCTION TO SEM IMAGING & X-RAY COMPOSITIONAL ANALYSIS.
Microscopy & Microanalysis 2009 Conference, Richmond, VA, 7/30.

WONG-NG, W. : RECENT METROLOGY DEVELOPMENT AT NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (NIST).
International Conference on Thermoelectrics (ICT 2009), Freiburg, Germany, 7/30.

FONG, J. : DESIGN OF A PYTHON-BASED PLUG-IN FOR BENCHMARKING PROBABILISTIC FRACTURE MECHANICS COMPUTER CODES WITH FAILURE EVENT DATA.
American Society of Mechnical Engineers (ASME) 2009 Pressure Vessels and Piping Division (PVPD) International Conference, Prague, Czech Republic, 7/30.

SCOTT, K. : THREE-DIMENSIONAL MICROANALYSIS USING FIB SEM VARIATIONS IN TECHNIQUE.
Microscopy & Microanalysis 2009 Meeting, Greater Richmond Convention Center, Richmond, VA, 7/30.

DAVIS, J. : SOLVING THE MICRO TO MACRO PROBLEM.
Microscopy & Microanalysis 2009 Conference, Greater Richmond Convention Center, Richmond, VA, 7/30.

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ANNOUNCEMENTS

PUBLICATIONS PRINTING DEADLINE, AUGUST 14, 2009
August 14 is the last day in FY 2009 to submit materials using FY 2009 funds to the Electronic Information and Publications Group (EIPG) for printing at the Department of Commerce or Government Printing Office. To assure timely processing, bring your Editorial Review Board-approved document or administrative printing job and appropriate paperwork to the EIPG office by close of business on Friday, August 14, 2009. The office is located on the mezzanine floor of the NIST Research Library in the Administration Building, Room E220. Questions? Ilse Putman, x2780 or Barbara Silcox, x2146.
NIST Contact: Ilse Putman, 301-975-2780, ilse.putman@nist.gov

VISITOR REGISTRATION FOR NIST EVENTS
Because of heightened security at the NIST Gaithersburg site, members of the public who wish to attend meetings, seminars, lectures, etc. must first register in advance. For more information please call or e-mail the "NIST Contact" for the particular event you would like to attend.
NIST Contact: . ., ., .

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NIST WEB SITE ANNOUNCEMENTS

No Web Site announcements this week.

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For more information, contact Ms. Sharon Hallman, Editor, Stop 2500, National Institute of Standards and Technology, Gaithersburg MD 20899-2500; Telephone: 301-975-TCAL (3570); Fax: 301-926-4431; or Email: tcal@nist.gov.

All lectures and meetings are open unless otherwise stated.

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