NIST Technicalendar May 11 to May 15, 2009 The NIST Technicalendar is issued each Friday. All items MUST be submitted electronically from this web page by 12:00 NOON each Wednesday unless otherwise stated in the NIST Technicalendar. The address for online weekly editions of the NIST Technicalendar and NIST Administrative Calendar is: http://www.nist.gov/tcal.

In this Issue: Meetings at NIST Meetings Elsewhere Announcements Talks by NIST Personnel NIST Web Site Announcements NIST Administrative Calendar (current)   NIST Vacancy Announcements (current)

Also available: Previous Issues of the Technicalendar Quick Technicalendar (current) Last week's Quick Technicalendar Last week's Technicalendar Detailed Search NIST Journal of Research (Current TOC) Change User Options

10:30 AM - ADVANCED MEASUREMENTS OF GREEN HOUSE GAS EMISSIONS FROM INDUSTRIAL FUGITIVE SOURCES AND AREA OPEN SOURCES
10:45 AM - Recent Results from the PANDA Spectrometer at FRM II
11:00 AM - Sustainable Manufacturing-What Would Make a Big Enough Difference
1:00 PM - What's New at TIP?

10:30 AM - Reengineering the optics of quantum dots
10:30 AM - Credulous Idolatry:The Use and Abuse of SUV in PET Scanning
10:45 AM - High Energy Neutron Scattering from Hydrogen
1:30 PM - Cationic Polyelectrolytes: From Nanoscale Fibers to Gene Therapy Vectors and Some Things in Between
2:00 PM - Metal-Organic Frameworks with Functional Pores for Recognition of Small Molecules
2:30 PM - Increased optical communication channel capacity through joint detection measurements

10:45 AM - Magnetic Imaging of Artificial Spin Ice in an Electron Microscope
12:30 PM - Spectroscopic Imaging of Soft Materials in the Cryo-Scanning Transmission Electron Microscope

10:00 AM - NCSCI Standards Information Day and Open House -- Thursday, May 14

10:30 AM - Programming the Universe
1:45 PM - From Average to Local Structure (PDF & a Rietveld Study of Zeolite-NdY/Se System)
2:30 PM - A quantum algorithm for solving linear sets of equations

5/11 -- MONDAY

10:30 AM - OPTICAL TECHNOLOGY AND PROCESS MEASUREMENT DIVISIONS: ADVANCED MEASUREMENTS OF GREEN HOUSE GAS EMISSIONS FROM INDUSTRIAL FUGITIVE SOURCES AND AREA OPEN SOURCES
Recently, many approaches has been developed and applied to address air emissions from industrial fugitive sources and area open sources. Most of these approaches apply for green house gas emission measurements for the same type of sources. These approaches may be divided into two categories: mobile platform (airborne or ground based) and stationary measurements. Whatever the mix of platforms and/or measurement techniques (optical remote sensing [ORS] or point monitors) in each of these measurement categories, the basic concept is almost always characterization of the plume dispersion downwind from the fugitive or area source and incorporating concurrent wind data for total flux calculations. In some instances, a combination of measurement techniques (and platform) may be the best solution for a specific measurement problem. Dr. Hashmonay has developed such solutions for the last 15 years and has worked on optical remote sensing for the last 21 years. He is the author of the USEPA OTM10 test method which is currently the only EPA's test method that addresses this issue of quantifying emissions from this type of sources. He is currently involved in new test method development to include new developments in this field. He will review in his presentation these approaches that include both measurement categories and both ORS and point monitors and several hybrid approches. Dr. Hashmonay will discuss the pros and cons of the mentioned approaches.
Ram Hashmonay , Director, Advanced Air Monitoring Solutions, ARCADIS, Raleigh-Durham, NC.
Bldg 221, Room B145. (NIST Contact: David Plusquellic, 301-975-3896, dplus@nist.gov)

10:45 AM - NIST CENTER FOR NEUTRON RESEARCH SEMINAR: Recent Results from the PANDA Spectrometer at FRM II
After a short introduction on some technical specialities of the cold neutron triple axis spectrometer PANDA, the speaker will discuss recent results obtained by his group at IFP (Institut für Festkörperphysik, TU Dresden) in collaboration with e.g. IFW-Dresden, MPI-CPfS, Oak Ridge National Laboratory and others and by external users. Their investigations comprise magnetic structures, phase diagrams, crystal field and collective excitations in frustrated systems like R2PdSi3 with R = heavy rare earths, in heavy-fermion superconductors like CeCu2Si2 or the newly discovered FeAs-based superconductors.
Michael Loewenhaupt , Technical University Dresden, Germany. ,.
235 Bldg, Rm. E100. (NIST Contact: Jeff Lynn, 301-975-6246, jeffrey.lynn@nist.gov)

11:00 AM - CERAMICS DIVISION SEMINAR: Sustainable Manufacturing-What Would Make a Big Enough Difference
"Sustainable Manufacturing" is an ideal to which consumers, politicians and business leaders increasingly aspire. Attempts to move towards this ideal have to date largely been limited to changes that are cost-neutral and do not change the customer proposition of goods or services. Accordingly they make rather small differences to the various impacts included within the "sustainability" bucket. What would make a big difference? This talk will start by reviewing our recently completed project "Well Dressed?" which examined the options for major change in the fashion industry. This was the first attempt to explore the changes required to transform a whole sector towards sustainability, and concluded that biggest effects would occur if driven by radical changes in consumer behavior. However, the project also showed that "sustainability" is an unreachable goal with unlimited measurement options, and that "manufacturing" is not a sufficiently broad area in which to make the required changes. Accordingly our work has moved towards "Engineering for a Low Carbon Future" - a wider range of solutions to a narrower target. The second part of the talk will therefore examine the engineering options for change to global carbon emissions. The need for a significant reduction in greenhouse gas emissions to combat climate change is now widely agreed, but the means to achieve it is highly uncertain. One politically popular approach is the dream of a carbon free energy supply, but providing this either by renewables, nuclear power, or carbon capture and storage requires an unprecedented scale of investment and construction. In parallel, step change reductions in energy demand must be made, but it is currently difficult to identify where sufficiently big differences can be made. The talk will present a top-down analysis of global energy use to direct attention to the big opportunities for energy efficiency. In particular, the talk will show that emissions from industry are dominated by production of five key materials (cement, steel, plastic, paper and aluminium) and will discuss the options for cutting these emissions in the face of likely demand growth. The talk will conclude by examining the measurement needs that will drive change towards both a low carbon and a more sustainable future. European developments are being directed very strongly by Life Cycle Assessment (LCA), but this has several problems which will be discussed. Bottom-up approaches to measurement (such as LCA) will be contrasted with top-down approaches. In particular the likelihood that different measurement techniques will direct efforts to make a big enough difference will be evaluated. About the Speaker: Julian Allwood's work spans innovative metal forming technologies and low carbon manufacturing. The first 10 years of his career were funded by contracts with the Alcoa Technical Centre in Pittsburgh, working on the modeling and control of hot and cold flat rolling. In 1996 he was appointed as a lecturer in mechanical engineering at Imperial College, and moved to the University of Cambridge in 2000. His current research group has parallel interests in developing innovative metal forming processes and exploring the systems and technologies of sustainable manufacturing. He is secretary to the scientific technical committee on metal forming of the CIRP, and since 2007 he has been joint editor-in-chief of the Journal of Materials Processing Technology. In 2008 he was awarded a 5-year EPSRC Leadership Fellowship to lead a £3.5m project on the global carbon emissions targets for steel and aluminium. MSEL Sustainability Seminar Series Organization Committee: K. Beers, M. Green, S. Hooker, R. Ricker, and W. Wong-Ng
Jullian Allwood , Senior Lecturer, Department of Engineering, Cambridge University, Cambridge, UK, jma42@eng.cam.ac.uk.
Administration Bldg, Employees Lounge. (NIST Contact: Winnie Wong-Ng, 301-975-5791, winnie.wong-ng@nist.gov)

1:00 PM - ,TECHNOLOGY INNOVATION PROGRAM SEMINAR: What's New at TIP?
Want to learn about the new technical activities under development at TIP and the 2009 competition currently under way? Or, TIP's plans, expectations, and critical national need topics for 2009 and beyond? These and related topics will be the subject of two NIST town meetings, open to all NIST staff. (The program is being repeated to accommodate schedules.) Provide us with YOUR input and join TIP for these informational exchanges. Please RSVP to Michelle Beddow, x8910 or michelle.beddow@nist.gov, in advance of each event.
Michael Schen , Senior Scientific Advisor to the Director of TIP. Thomas Wiggins , Director, Selection Management Office.
Administration Bldg, Lecture Rm. F. (NIST Contact: Michael Schen, 301-975-6741, michael.schen@nist.gov)


5/12 -- TUESDAY

10:30 AM - ATOMIC PHYSICS DIVISION SEMINAR: Reengineering the optics of quantum dots
Dynamical control of excitons in quantum dots (QDs) is highly desirable for applications of QD optics. For QDs embedded in nanomechanical structures, this control could be obtained by using externally imposed mechanical strain to reengineer the QD structure to modify levels, polarize optical transitions, or induce coupling between closely spaced dots, all capabilities needed to use dots in optical nanodevices and quantum information processing. To exploit the potential of hybrid nanomechanical/QD devices, one must understand the interaction between internal strain due to lattice mismatch, externally imposed mechanical strain, and the excitons in the QDs in the nanomechanical structure. I describe our atomistic theory of pyramidal InAs QDs in strained GaAs nanomechanical bridges. Results are presented to show how the dots are structurally reengineered and how this modulates the optics of the confined excitons. Consequences for the quantum optics of quantum dots will be discussed.
Garnett Bryant , Atomic Physics Division, NIST and NIST/UMD Joint Quantum Institute.
Physics Building, Room B145. (NIST Contact: Gail Newrock, 301-975-3200, gail.newrock@nist.gov)

10:30 AM - NIST BIOIMAGING SEMINAR (SPONSORED BY IONIZING RADIATION DIV.): Credulous Idolatry:The Use and Abuse of SUV in PET Scanning
Positron Emission Tomography (PET) imaging has become a major tool for diagnosis and tumor monitoring. The growth of PET imaging has spawned new product lines such as PET-CT units and PET isotope distribution services which are located around the world. A host of novel PET agents are being developed that should add specificity to the current glucose-based PET agent. However, if PET is to become truly quantitative, as required by the FDA, better methods of measuring uptake must be developed. The "SUV" as currently obtained varies according to manufacturer and even within software releases from the same manufacturer. Moreover, new "resolution recovery methods" favor image "beautification" over image"quantitation" further degrading SUV reproducibility. This talk will highlight the potentials and problems surrounding quantitative PET.
Peter Choyke , Chief, Molecular Imaging Program, National Cancer Institute, Bethesda, MD.
Radiation Physics (245) Bldg, Rm. C301. (NIST Contact: Brian Zimmerman, 301-975-4338, bez@nist.gov)

10:45 AM - NIST CENTER FOR NEUTRON RESEARCH SEMINAR: High Energy Neutron Scattering from Hydrogen
The scattering from hydrogen in polythene has been measured with the direct time-of flight spectrometer, MARI, at the ISIS facility of the Rutherford Appleton Laboratory with incident neutron energies between 0.5eV and 600 eV. These experiments are interesting because the results of experiments from the indirect time-of-flight spectrometer, VESUVIO, gave intensities in this energy range for most hydrogen containing materials that were about 60% of the intensity expected from hydrogen and this was initially interpreted as due to entanglement. Since VESUVIO is the only instrument in the world that routinely operates with incident neutron energies in the eV range they considered that it would be worthwhile to measure the scattering from hydrogen at high incident neutron energies on a different type of instrument. The MARI direct time-of-flight instrument was chosen and they have studied the scattering for several different incident neutron energies. After several problems they obtained good data which after background subtraction, calibration of the incident energy and conversion to an energy spectra gave the intensity of the hydrogen scattering as within error independent of the wave vector transfer for scattering angles from about 1 degree up to 70 degrees for 3 incident neutron energies between 10 eV and 100 eV. When the data was put on an absolute scale, by measuring the scattering from 5 metal foils of known thicknesses under the same conditions they found that the absolute intensity of the scattering from the hydrogen was in agreement with that expected by conventional theory to an accuracy of 3.0% over a wide range of wave-vector transfers. They consider that these measurements and some recent measurements with a VESUVIO time-of-flight instrument in Argentina show that the many results on hydrogen using the VESUVIO spectrometer were incorrect and that there is no need for any novel explanation. They have also used high energy neutron scattering to study electronic excitations and some recent results on YBCO and NiO will be discussed and compared with the RIXS results.
Roger Crowley , University of Oxford,. ,.
235 Bldg, Rm. E100. (NIST Contact: Peter Gehring, 301-975-3946, peter.gehring@nist.gov)

1:30 PM - POLYMERS DIVISION SEMINAR: Cationic Polyelectrolytes: From Nanoscale Fibers to Gene Therapy Vectors and Some Things in Between
Timothy Long , Virginia Tech.
224 Bldg, Rm. A312. (NIST Contact: Gale Holmes, 301-975-5280, gale.holmes@nist.gov)

2:00 PM - NIST CENTER FOR NEUTRON RESEARCH SEMINAR: Metal-Organic Frameworks with Functional Pores for Recognition of Small Molecules
By enforcing the constrain of the pore/cavity to selectively include and/or exclude some special substrates, and by making use of the weak interactions to direct molecular recognition, they have initiated a research program to rationally design and synthesize functional microporous organic/inorganic hybrid materials for recognition of small molecules. The challenge to develop such functional microporous materials is to functionalize the micropores, so that they can be uniquely suited for specific host-guest recognition. To control the pore sizes/curvatures and to incorporate open metal sites for specific molecular recognition, they have addressed such a challenge, specifically by (1) rational synthesis of ?-Po net to systematically tune the micropores and incorporate functional organic sites, (2) formation of open metal sites within the pores, and (3) construction of mixed-metal-organic frameworks (M'MOFs) to immobilize open/catalytically active metal sites. The special feature of their research is to establish the general principles to construct functional pores and to develop highly robust and functional microporous hybrid materials for their practical applications in small molecules' storage, separation, purification and sensing, in enantioselective separation and asymmetric heterogeneous catalysis.
Banglin Chen , University of Texas, Pan American.
235 Bldg, Rm. E100. (NIST Contact: Yun Liu, 301-975-6235, yun.liu@nist.gov)

2:30 PM - QUANTUM TELECOMMUNICATIONS SEMINAR: Increased optical communication channel capacity through joint detection measurements
Zachary Dutton , BBN, Cambridge, MA.
Radiation Physics Bldg, Rm. B105. (NIST Contact: Charles Clark, 301-975-3709, charles.clark@nist.gov)


5/13 -- WEDNESDAY

10:45 AM - NIST CENTER FOR NEUTRON RESEARCH SEMINAR: Magnetic Imaging of Artificial Spin Ice in an Electron Microscope
Most materials are expected to become perfectly ordered at low temperature, but some cannot because their ordered state is not a unique ground state. A famous example of this is ice, where competing interactions prevent protons from ordering at low temperature. Spin ices exhibit the same physics, with an analogous crystalline structure but residual entropy due to magnetic disorder. Many questions remain for these systems, partly because the role of crystal imperfections is not understood. Toward this end, a new model system has recently been proposed and demonstrated that takes advantage of nanolithography to create synthetic magnetic lattices, dubbed "artificial spin ice". Interactions within these patterns are expected to reveal the same physics, but prior results show only a statistical trend toward obedience of an ice rule. The speaker will present extensions of this work to a new lattice and show that the resulting magnetic arrangements exhibit the perfect frustration one would expect for a T=0 spin ice. With this, the system is poised to answer basic questions of frustrations, such as the role of crystal imperfections in sustaining or removing the disordered state. Additionally, it illuminates the role frustration and entropy might play in technologically important magnetic systems, such as patterned-media magnetic memory.
John Cumings , University of Maryland. ,.
235 Bldg, Rm. E100. (NIST Contact: Jason Gardner, 301-975-8391, jason.gardner@nist.gov)

12:30 PM - SURFACE AND MICROANALYSIS SCIENCE SEMINAR: Spectroscopic Imaging of Soft Materials in the Cryo-Scanning Transmission Electron Microscope
Matthew Libera , Stevens Institute of Technology.
215 Bldg., H107 Rm.. (NIST Contact: John Henry Scott, 301-975-4981, johnhenry.scott@nist.gov)


5/14 -- THURSDAY

10:00 AM - STANDARDS SERVICES DIVISION SEMINAR: NCSCI Standards Information Day and Open House -- Thursday, May 14
Did you know there is a standard for ~ Capturing criminal mugshots? ~ Installing a laser at home? ~ Slipperiness in bathtubs? If you use standards in your work, need research assistance for standards, access to standards, or support in your standards committee work, visit NCSCI and learn all about our standards services. There will also be Refreshments, Prizes, and more Fun than usual! NCSCI is your source for standards information at NIST! NCSCI, Bldg. 222, Room B107, 10 a.m. - Noon, http://www.nist.gov/ncsci/ Please note: Non-NIST guests must make prior arrangements to attend. Please call 301-975-4040 or email: ncsci@nist.gov.
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Bldg 222, Rm. B107. (NIST Contact: Brenda Umberger, 301-975-4040, ncsci@nist.gov)


5/15 -- FRIDAY

10:30 AM - NIST COLLOQUIUM SERIES: Programming the Universe
What is the universe made of? The conventional view states that it is made up of matter and energy, of fields and elementary particles. But there is a more fundamental view: universe is made up of information, and at the bottom, it is made up of bits. Drawing from recently developed theories of quantum computation, we show how information and information processing form and shape the universe, from its smallest to its largest scales.
Seth Lloyd , Director, Center for Extreme Quantum Information Theory, Massachusetts Institute of Technology.
Administration Building, Green Auditorium. (NIST Contact: Kum Ham, 301-975-4203, kham@nist.gov)
Special Assistance Available

1:45 PM - NIST CENTER FOR NEUTRON RESEARCH SEMINAR: From Average to Local Structure (PDF & a Rietveld Study of Zeolite-NdY/Se System)
PDF and Rietveld studies of dry Se/zeolite-NdY system will be presented. Deviations of the local structure from the average structure will be highlighted using a Rietveld refinement and an r-series PDF fitting. Distortions of the framework due to the encapsulated guest atoms, especially in the vicinity of the Se nanoclusters, are observed in the PDF model, while the Rietveld refinement yielded an average structural model for the system. The need of both techniques to accurately model structures of such systems will be emphasized. The future plans include QENS, and extending this study towards nanoclusters in single crystals and different hosts, will also be discussed.
Simon Moss , University of Houston. ,.
235 Bldg, Rm. E100. (NIST Contact: Dan Neumann, 301-975-5252, dan@nist.gov)

2:30 PM - QUANTUM INFORMATION SEMINAR: A quantum algorithm for solving linear sets of equations
Seth Lloyd , MIT, Cambridge, MA.
Radiation Physics Bldg, Rm. B105. (NIST Contact: Charles Clark, 301-975-3709, charles.clark@nist.gov)


ADVANCE NOTICE

5/18/09 1:00 PM - ,TECHNOLOGY INNOVATION PROGRAM SEMINAR: What's New at TIP?
Want to learn about the new technical activities under development at TIP and the 2009 competition currently under way? Or, TIP's plans, expectations, and critical national need topics for 2009 and beyond? These and related topics will be the subject of two NIST town meetings, open to all NIST staff. (The program is being repeated to accommodate schedules.) Provide us with YOUR input and join TIP for these informational exchanges. Please RSVP to Michelle Beddow, x8910 or michelle.beddow@nist.gov, in advance of each event.
Michael Schen , Senior Scientific Advisor to the Director of TIP. Thomas Wiggins , Director, Selection Management Office.
Administration Bldg, Lecture Rm. F. (NIST Contact: Michael Schen, 301-975-6741, michael.schen@nist.gov)

5/19/09 10:30 AM - ATOMIC PHYSICS DIVISION SEMINAR: The Direct Observation of a Cooper Pair Insulator
Ultra-thin amorphous films can display a startlingly large range of electrical conductivity as their thickness or an applied magnetic field is varied. In the T=0 limit, their conductivity either crashes to zero or diverges to infinity resulting in a quantum superconductor-insulator transition (SIT). Universal models of these SITs rest upon the assumption that Cooper pairs occupy the insulating as well as the superconducting state. Experimentally, no clear evidence for this assumption has been offered. I will present investigations of a new film system with a regular nanohoneycomb array of holes which definitively demonstrates, through charge 2e magnetoresistance oscillations, the presence of Cooper pairs in the insulating phase. The most salient characteristics of Cooper pair insulators will also be identified by way of comparison to other film systems.
Michael Stewart , Brown University.
Physics Building, Room B145. (NIST Contact: Neil Zimmerman, 301-975-5887, neil.zimmerman@nist.gov)

5/20/09 1:30 PM - WORLD METROLOGY DAY: NIST's 3rd Annual Celebration of World Metrology Day
Date: May 20, 2009 Time: 1:30 p.m. to 4:00 p.m. Location: Red Auditorium and Hall of States Boulder: Auditorium in Building 1 at NIST, Bouler has been reserved for VTC*** NIST will hold its third annual celebration of World Metrology Day on Wednesday, May 20, 2009. The Metre Convention was signed on 20 May 1875, a date now celebrated as World Metrology Day. The Convention created the International Bureau of Weights and Measures (BIPM) and set the framework for global collaboration in the science of measurement and in its industrial, commercial and societal application. The original aim of the Metre Convention – the worldwide uniformity of measurement – remains as important today, in 2007, as it was in 1875. Join us in celebrating World Metrology Day -- a celebration of our core foundation and purpose! The theme for 2009 is Measurements in Commerce: Metrology Underpinning Economic Development. NIST research and measurements provide a significant foundation for measurements in support of our global economy. Speakers will include: · U.S. Metric Transition: Maximizing Opportunities and Reducing Barriers to Increase SI Use, Elizabeth J. Gentry (TS) · When is a Pound of Fish Only Fourteen Ounces? Lisa Weddig, Director of Regulatory and Technical Affairs, National Fisheries Institute and Secretary of the Better Seafood Board · Traceable Measurements of Contaminants and Nutrients in Foods in Support of Increasing International Requirements, Dr. Robert Kaarls, Secretary, International Committee of. Weights and Measures, President, Consultative Committee on Metrology in Chemistry Poster sessions from the NIST laboratories will be held after the speaker session in the Hall of States, along with refreshments. For more information: Dr. Belinda Collins (TS), x4500, belinda.collins@nist.gov. Non-NIST visitors contact Sandra Auchmoody by May 15th for visitor access, x4500, Sandra.auchmoody@nist.gov.
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Administration Bldg, Red Auditorium. (NIST Contact: Belinda Collins, 301-975-4500, belinda.collins@nist.gov)

5/22/09 11:00 AM - CERAMICS DIVISION SEMINAR: Small Scale Materials Testing and Microstructural Characterization for Nuclear Applications
The increasing demand for electrical power in addition to the need to reduce greenhouse gas emissions drives the development of advanced nuclear systems. One of the bottlenecks in designing these systems is the development of materials which are usable up to high dose, temperature, and in contact with different coolant environments. Limited resources and high costs for using radiation facilities push the need for basic science studies using accelerator facilities to study the initial behavior of materials in radiation environments. In addition, the reduced radiation dose around low energy ion beams allow one to irradiate in a wide range of specimen environments (e.g. different cooling environments, variable temperature, etc.) as well as allowing for more in situ studies. In order to use low energy (6MeV) ion beams and be able to handle active materials, the sample size has to be rather small. Therefore, small scale materials testing techniques (nanoindentation, microcompression testing, microtensile testing, etc.) have to be developed and applied on engineering alloys in order to characterize the specimen during or after irradiation. In order to compare the small scale materials testing to macroscopic materials properties, the material of interest has to be understood down to smallest scale. In addition advanced characterization techniques such as Local Electron Atom Probe (LEAP) allow one to obtain a more detailed insight of the materials microstructure while keeping the sample size small. This presentation will give an overview of how to apply small scale mechanical testing after accelerator irradiations and how LEAP can bring more insight of the materials structure and composition before and after irradiation.
Peter Hosemann , Los Alamos National Laboratory.
Materials Building, Rm. A252. (NIST Contact: Dylan Morris, 301-975-5458, dylan.morris@nist.gov)

5/26/09 10:30 AM - CNST NANOFABRICATION RESEARCH GROUP SEMINAR: Vertical Molecular Transistors
We demonstrate a universal method in which a new type of nanometer-sized, ambipolar, vertical molecular transistor is fabricated in parallel fashion. This Central-Gate Molecular Vertical Transistor (C-Gate MolVeT) is fabricated by a combination of conventional micro-lithography techniques and self-assembly methods. Here we will show several examples which utilize this device to investigate transport phenomena on the molecular scale.
Shachar Richter , School of Chemistry and University Center for Nanoscience and Nanotechnology,Tel Aviv University,.
Bldg. 217, Rm H107. (NIST Contact: Nikolai Zhitenev, 301-975-6039, nikolai.zhitenev@nist.gov)

5/27/09 10:30 AM - BIOCHEMICAL SCIENCE DIVISION SEMINAR: Factors Affecting Detection of Pathogenic E. coli and Salmonella in Mixed Cultures
Enteric pathogens, such as pathogenic E. coli and Salmonella are estimated to account for over one million cases of gastrointestinal illness annually. Although the vast majority of cases are not fatal, occasional deaths have been reported, particularly for the enterohemorrhagic E. coli (e.g., E. coli O15:H7). At least five groups of pathogenic E. coli have been described based on infection site, symptoms and virulence factors: enterohemorrhagic E. coli (EHEC) enteropathogenic E. coli (EPEC), enterotoxigenic E. coli (ETEC), enteroinvasive E. coli (EIEC) and diffusely adherent E. coli (DAEC). Because EHEC are the most virulent, research has focused on characterization of these strains and their prevalence in the environment. Although E. coli serotype O157:H7 is the most common strain, at least six non-O157 serogroups are considered of importance (O26, O43, O103, O111, O121, O143); these strains may be under represented due to the absence of a selective medium. The most virulent EHEC strains carry the virulence genes for shiga toxin production (stx1 and/or stx2), attachment to intestinal walls (eae, tir), and hemolysin (hly). Immunoassays have been developed for detection of different serogroups and/or PCR assays for virulence genes; however, each of these factors is widely distributed among generic, non-pathogenic E. coli. Consequently, there is no single factor, or, as yet, combination of factors that can definitively identify EHEC in a mixed microbial culture. However, based on the quantitative nature of real-time PCR, one may infer the presence of EHEC if the concentrations of all virulence factors are identical. Salmonella appears to be less problematic. Cell surface invasions (e.g., invA), which appear to be both unique to Salmonella and also common to all Salmonella strains can be detected via real-time PCR. However, PCR assays frequently give a positive result in mixed cultures where subsequent isolation is impossible due to competition for growth in enrichment or detection media. Consequently, the question arises: can detection by immunological or nucleic acid based techniques without concomitant isolation of a culture be accepted as an unequivocal positive result?
Dan Shelton , Research Leader. Jeff Karns , Microbiologist. JoAnne van Kessel, Animal Scientist
227 Bldg, Rm. A202. (NIST Contact: Jayne Morrow, 301-975-6722, jayne.morrow@nist.gov)

6/5/09 3:00 PM - CNST NANOFABRICATION RESEARCH GROUP SEMINAR: 3D nanoscopy with a double-helix microscope
Abstract: Double-helix point spread function (DH-PSF) is an engineered three-dimensional (3D) PSF specifically designed for 3D position estimation and imaging. It exhibits two lobes that rotate continuously around the optical axis with propagation. An information theoretical analysis shows that the DH-PSF carries higher and more uniform Fisher Information about a particle's 3D position than the PSF of traditional imaging systems. Experiments with DH-PSF demonstrate nanometer scale 3D position localization precisions. Further, a variety of two-dimensional microscope modalities such as bright-field, dark-field, and fluorescence can be directly transformed into their 3D counterparts by placing a DH-PSF phase mask in their imaging paths. Using photoactivatable fluorophores with a DH-PSF microscope opens up avenues for improving 3D imaging resolution beyond the optical diffraction limit. Bio: Sri Rama "Prasanna" Pavani is a doctoral student in the department of Electrical and Computer Engineering at the University of Colorado - Boulder, where he is a CDM Optics fellow and a COSI Associate fellow. Prasanna's primary research interest is in developing computational optical sensing and imaging (COSI) systems to capture information that is normally lost in traditional imaging systems. In the last few years, he has applied the COSI paradigm to applications like quantitative phase imaging, 3D PSF engineering, 3D tracking / velocimetry, and recently to 3D superresolution imaging. His doctoral research has been recognized with an OSA outstanding paper award, a SPIE optical science and engineering scholarship, and two Colorado Photonics Industry Association best poster awards. More information on Prasanna's research can be found here: http://eces.colorado.edu/~pavani/
Sri Rama Prasanna Pavani , Dept. of Electrical and Computer Engineering, University of Colorado at Boulder.
Bldg. 217, Rm. H107. (NIST Contact: Andrew Berglund, 301-975-2844, andrew.berglund@nist.gov)

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MEETINGS ELSEWHERE


5/11 -- MONDAY

9:00 AM - 2009 INTERNATIONAL CONFERENCE ON FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS
Call for Papers! Abstract Deadline: December 17, 2008 This conference will be examining the latest advances in characterization and metrology that will help shape the future of the nanoelectronics revolution. This is an excellent opportunity for you to participate by submitting an abstract for a contributed poster to demonstrate your expertise in nanoelectronics. The conference papers will be published in a hardback proceedings by the American Institute of Physics. Papers are solicited to address characterization and metrology for: 300 mm; Alternative Gate Dielectrics; Beyond CMOS; Breakthroughs in Electron Microscopy; Breakthroughs in Lithography; Channel Engineering (e.g., strained silicon, 3/5s); Contamination, Detection, and Identification; Critical Analytical Techniques; Defects; Device Manufacturing; Diagnostics; In-Situ, Real-Time Control and Monitoring; Integrated Metrology; Interconnects - Present or Future; Lab-on-a-Chip; MEMS/NEMS Metrology Applications; Modeling/Simulation; Nanoelectronics Materials and Devices; Novel Measurement Methods, Breakthroughs; Thin-Films; Ultra-Shallow Junctions; Wafer Fab; Wafer Manufacturing and New Substrate Materials NIST has co-sponsored this conference series since its inception in 1995, and the University at Albany is part of the Index NRI Center. Please visit our conference website at www.eeel.nist.gov/812/conference/ for abstract submission guidelines, registration information, and other details.
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Bldg, Rm..
College of Nanocalse Science and Engineering, University at Albany, Albany, New York, USA. (NIST Contact: David Seiler, 301-975-2074, david.seiler@nist.gov) www.eeel.nist.gov/812/conference/



5/12 -- TUESDAY

11:00 AM - CARNEGIE INSTITUTION OF WASHINGTON/GEOPHYSICAL LAB. SEMINAR: GEONEUTRINOS AND HEAT PRODUCTION IN THE EARTH: CONSTRAINTS AND IMPLICATIONS
B McDonough , University of Maryland.
Bldg, Rm..
Greenewalt Bldg., GL-DTM Grounds, Carnegie Institution of Washington, DC. (NIST Contact: A. Goncharov, 202-478-8900, seminar@lists.ciw.edu)



5/13 -- WEDNESDAY

No Scheduled Events

5/14 -- THURSDAY

No Scheduled Events

5/15 -- FRIDAY

No Scheduled Events

ADVANCE NOTICE

No Scheduled Events

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TALKS BY NIST PERSONNEL

KESSEL, R. : EVOLUTION OF MODERN APPROACHES TO EXPRESS UNCERTAINTY IN MEASUREMENT.
International Atomic Energy Agency Workshop on Evaluation of Uncertainty in Measurement, Vienna, Austria, 5/11.

STAYMATES, M. : THE INTERNAL FLUID MECHANICS OF EXPLOSIVE TRACE DETECTORS USING COMPUTATIONAL FLUID DYNAMICS.
IEEE Conference on Technologies for Homeland Security, Waltham, MA, 5/11.

COLEMAN, J. : GELATIN-BASED VAPOR VERIFICATION SAMPLES FOR TRACE VAPOR DETECTORS.
IEEE Conference on Technologies for Homeland Security, Waltham, MA, 5/11.

JONES, R. : CROSS SECTIONAL MEASUREMENTS OF SUB-50NM STRUCTURES USING CD-SAXS.
Frontiers of Characterization and Metrology for Nanoelectronics Conference, Albany, NY, 5/12.

MARINENKO, R. : UNCERTAINTIES IN ELECTRON PROBE MICROANALYSIS.
European Microbeam Analysis Society 11th European Workshop, Gdansk, Poland, 5/12.

WU, W. : USING X-RAY TO CHARACTERIZE PLANAR AND NONPLANAR NANOSTRUCTURES.
2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Albany, NY, 5/13.

SOLES, C. : MEASUREMENTS FOR THE DIRECT NIL PATTERNING OF ORGANOSILICATE MATERIALS.
Nano Hybrid 2009 - US Japan Workshop on Future Trends in Organic/Inorganic Nanocomposite Hybrid Materials, Himeji, Japan, 5/13.

JONES, R. : MEASUREMENTS OF SUB-30NM STRUCTURES OVER LARGE AREAS USING GRAZING INCIDENCE SMALL ANGLE X-RAY SCATTERING.
Frontiers of Characterization and Metrology for Nanoelectroncs Conference, Albany, NY, 5/13.

SZAKAL, C. : SURFACE ANALYSIS BY DESORPTION MASS SPECTROMETRY AT NIST.
International Conference on Frontiers of Characterization and Metrology for Nanoelectronics 2009, Albany, NY, 5/14.

KESSEL, R. : THE METROLOGY VIEW ON UNCERTAINTY IN MEASUREMENT.
International Atomic Energy Agency Workshop on Evaluation of Uncertainty in Measurement, Vienna, Austria, 5/14.

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ANNOUNCEMENTS

VISITOR REGISTRATION FOR NIST EVENTS
Because of heightened security at the NIST Gaithersburg site, members of the public who wish to attend meetings, seminars, lectures, etc. must first register in advance. For more information please call or e-mail the "NIST Contact" for the particular event you would like to attend.
NIST Contact: . ., ., .

BALDRIGE TRAINING AT NIST
The Baldrige National Quality Program will be hosting its Examiner Preparation course for its board of Examiners each Tuesday through Friday beginning April 28 to May 22. Approximately 130 or more Examiners will be attending each week. The Baldrige Examiners will be eating breakfast in the cafeteria each day beginning at 7:15 a.m. They will use the West end serving area of the cafeteria for lunches in order to alleviate congestion in the main cafeteria serving area. Should you have any questions or concerns, please contact Jackie DesChamps at ext. 3771.
NIST Contact: Jacqueline Deschamps, 301-975-3771, jacqueline.deschamps@nist.gov

PUBLICATIONS PRINTING DEADLINE AUGUST 14, 2009
August 14 is the last day in FY 2009 to submit materials using FY 2009 funds to the Electronic Information and Publications Group (EIPG) for printing at the Department of Commerce or Government Printing Office. To assure timely processing, bring your Editorial Review Board-approved document or administrative printing job and appropriate paperwork to the EIPG office by close of business on Friday, August 14, 2009. The office is located on the mezzanine floor of the NIST Research Library in the Administration Building, Room E220. Questions? Ilse Putman, x2780 or Barbara Silcox, x2146.
NIST Contact: Ilse Putman, 301-975-2780, ilse.putman@nist.gov

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NIST WEB SITE ANNOUNCEMENTS

ISD NEWSCENTER
Keep up with NIST Research Library news! Read/subscribe to ISD NewsCenter.
NIST Contact: nancy allmang, 301-975-4189, nancy.allmang@nist.gov

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For more information, contact Ms. Sharon Hallman, Editor, Stop 2500, National Institute of Standards and Technology, Gaithersburg MD 20899-2500; Telephone: 301-975-TCAL (3570); Fax: 301-926-4431; or Email: tcal@nist.gov.

All lectures and meetings are open unless otherwise stated.

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