NIST Technicalendar July 21 to July 25, 2008 The NIST Technicalendar is issued each Friday. All items MUST be submitted electronically from this web page by 12:00 NOON each Wednesday unless otherwise stated in the NIST Technicalendar. The address for online weekly editions of the NIST Technicalendar and NIST Administrative Calendar is: http://www.nist.gov/tcal/.

In this Issue: Meetings at NIST Meetings Elsewhere Announcements Talks by NIST Personnel NIST Web Site Announcements NIST Administrative Calendar (current)   NIST Vacancy Announcements (current)

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10:30 AM - Low energy-spread ion beams from a trapped atomic gas
10:30 AM - Next-Generation Infrared Photodetectors Using Novel InAs/GaSb Superlattices
10:30 AM - The Future CAD Interoperability: History-Based Parametrics
10:45 AM - Evolution of the CE-phase in Layered Manganites

No Scheduled Events

3:30 PM - Robots - Ready or Not?

10:00 AM - Dynamic Transmission Electron Microscope: Studying Nanoscale Material Processes with Nanosecond Time Resolution and Beyond

10:45 AM - Anisotropic Breakdown of the Fermi Liquid at a Quantum Critical Point
11:00 AM - Focused ion and electron beam nanofabrication: new developments
1:30 PM - Neutron Imaging for the Hydrogen Economy
3:00 PM - Constraining Isotropic Shifts in the Speed of Light

7/21 -- MONDAY

10:30 AM - CNST ELECTRON PHYSICS GROUP SEMINAR: Low energy-spread ion beams from a trapped atomic gas
Pulsed and continuous ion beams are used in applications such as focused ion beams. The smallest achievable spot size in focused ion beam technology is limited by the monochromaticity of the ion source. Here we present energy spread measurements on a new source concept, the ultracold ion source [1,2]. It produces ion beams by near-threshold ionization of laser cooled atoms. In recent detailed particle tracking simulations we found that the brightness of such a source can compete with that of the industry standard liquid metal ion source (LMI) but offers the advantage of reduced longitudinal energy spread [1]. In the experiment, rubidium atoms are captured in a magneto-optical trap inside an accelerator structure where they are ionized by a pulsed laser in a DC electric field. The resulting cold ion bunch is accelerated towards a multi-channel plate detector where the time-dependent ion current is measured. The relative spread in time of flight to the detector is a good measure for the relative longitudinal energy spread in the bunch. Two order of magnitude lower energy spread is achieved compared to the liquid-metal ion source. Bunches with an energy of only 2 eV are produced with an rms energy spread as low as 0:01 eV.
Edgar J. Vredenbregt , Dr./Department of Applied Physics, Eindhoven University of Technology, The Netherlands.
217 Bldg., H107 Rm.. (NIST Contact: Jabez McClelland, 301-975-3721, jabez.mcclelland@nist.gov)

10:30 AM - ATOMIC PHYSICS DIVISION SEMINAR: Next-Generation Infrared Photodetectors Using Novel InAs/GaSb Superlattices
The InAs/GaSb superlattice photodetector is an emerging technology in the mid-infrared detection field, with performance that rivals the state-of-the-art HgCdTe photodiodes in the long wavelength infrared range. Combining the advantages of quantum engineering and advanced III-V molecular beam expitaxy (MBE) growth techniques, this technology is a promising candidate for next generation mid-infrared focal plane arrays. In this talk, I will first show a novel design of InAs/GaSb superlattice photovoltaic detectors that use intersubband relaxation as the carrier collecting mechanism; this design aims at reducing the dark leakage current. Moreover, I will evaluate fundamental figures of merit including the dark leakage current and quantum efficiency. By fine-tuning the sidewall mesa etching and sample preparation, we can reduce the sidewall leakage current.
Shin Mou , IBM.
Physics Building, Room B145. (NIST Contact: Neil Zimmerman, 301-975-5887, neil.zimmerman@nist.gov)

10:30 AM - MANUFACTURING SYSTEMS INTEGRATION DIVISION SEMINAR: The Future CAD Interoperability: History-Based Parametrics
The Future of CAD Interoperability:History-Based Parametrics Monday July 21, 2008 AMSANT Lab conference room Building 220 (Metrology) Room B-105 Organizer: Michael Leyton mleyton@dimacs.rutgers.edu A major revolution is occurring in CAD interoperability. Standardly, the transfer of a CAD model has been of a snapshot of the model. In the last few years, ISO has begun to understand that this type of data exchange misses what is necessary for the receiving system to make intelligent modification and use of the transferred CAD model. What is missing is the design intent as captured by the construction history, parametric relationships, and design constraints, used in the creation of the model. A transferred CAD model without history-based parametrics is now officially referred to as dumb, whereas a transferred CAD model with history-based parametrics is referred to as smart – because it allows the receiving system to act intelligently. It is now believed that history-based parametrics will be a major aspect of the future of CAD interoperability. In the week of July 21-25, a number of the world's leading experts on history-based parametrics are meeting at NIST to discuss the previous and future work in this area. On the first day of the meeting, they will present a public symposium consisting of a set of 4 talks that summarize the issues involved in this important revolution in CAD interoperability. The 4 talks are listed below followed by the abstracts. You are very welcome to attend. 10:30 – 11:00am: Norio Matsuki (AIST, Japan) A CAD System Based on Procedural Curve and Surfaces 11am-12: Soonhung Han (KAIST, Korea) : Macro-Parametric - an Approach for the History-Based Parametrics 2-3pm: Shuming Gao (Zhejiang University, China): Real-Time Collaborative Modeling with Heterogeneous CAD Systems Based on Neutral Modeling Commands 3-4pm: Michael Leyton (Rutgers University, USA): Mathematical Unification of the Product Lifecycle. ABSTRACTS A CAD System Based on Procedural Curve and Surfaces Norio Matsuki AIST Current CAD systems use parametric curves and surfaces of B-spline or NURBS format to express product shapes precisely. Many important data such as intersection curves in CAD systems, however, are defined by approximation with tolerances, and many problems occur in the later calculation as the result of this approximation. In this presentation, the procedural curve and surface (procedural geometry) method is proposed to solve this problem. Procedural geometry method does not use any explicit expression format for geometry data, but it provides interfaces to calculate geometrical values of given curves and surfaces. And I suggest that procedural geometry can be a promising candidate for data representation core in the future CAD systems showing examples of intersection curve and blending surface in the form of procedural geometry. Macro-parametric - an approach for the history-based parametrics Soonhung Han KAIST Current STEP translation is based on B-rep geometry. As this translation scheme is based on evaluated geometry, we cannot deliver the feature tree and therefore we cannot restore the feature information after the translation. It means the powerful parametric design changes cannot be performed after the translation. The idea of the macro-parametric approach is to capture the history of modeling commands of users in a log (or a macro) file and the commands in the log file are translated into the corresponding commands in the receiving CAD system. The translated commands can be used to reconstruct the same model inside the receiving CAD system. The other approach taken in the STEP Part 111 is to translate the feature trees between two CAD systems. The iCAD laboratory of KAIST has been experimenting the macro-parametric approach since 2000. In this talk the idea and experimental experience until now will be presented together with difficulties and solutions at the hands. Real-Time Collaborative Modeling with Heterogeneous CAD Systems Based on Neutral Modeling Commands Shuming Gao Zhejiang University This talk will present an integration-based solution for developing a real-time collaborative modeling platform on heterogeneous CAD systems. Different from the visualization-based approaches, the product models are allowed to be constructed and be modified from various sites together in the proposed collaborative modeling platform which is developed based on a mechanism for the translation between system modeling operations (SMO) and neutral modeling commands (NMC). Every operation given by a user on one site is translated into an NMC and transmitted to all the other sites through network, and then the received NMC is converted into corresponding SMOs on every other site instantaneously. Since only the commands but not the product data are transferred, the data size under transmission is greatly reduced, so that a real-time synchronization can be achieved with a standard network bandwidth. In the talk, a web services based platform for exchange of procedural CAD models between heterogeneous CAD systems will also be presented, which is the extension of our real-time collaborative modeling platform. Mathematical Unification of the Product Lifecycle. Michael Leyton Rutgers University The product lifecycle involves numerous languages from multiple engineering disciplines, computational systems, physical sciences and cognitive sciences. In a series of books, I have argued that there is a single interoperable language that unifies the entire product lifecycle. This mathematical language has been developed in my books, and has been shown to give new foundations to geometry that are comprehensively procedural. In fact, these new foundations define a geometric object as a memory store of history. The consequence is that this new system of geometry – all its mathematics and concepts – are the complete opposite of the standard foundations of geometry that have existed for the last 3000 years, from Euclid to modern physics including Einstein. The new mathematics unifies all stages of product design, from sketching and part-design to assembly planning, as well as machining, and all the sciences including classical and quantum mechanics, general relativity, quantum field theory, and biology, as well as giving a comprehensive mathematical theory of object-oriented programming, and the cognitive sciences. In further support of my claim that this language unifies the product lifecycle, it should be also noted that the mathematics of my new foundations have been applied by scientists in over 40 disciplines, including radiology, chemical engineering, motor control, meteorology, geology, computer graphics, anatomy, linguistics, robotics, botany, computer vision, architecture, structural engineering, artificial intelligence, etc.
Norio Matsuki , AIST, Japan. Soohung Han , KAIST, Korea. Shuming Gao, Zhejiang University, China Michael Leyton, Rutgers University, USA
Metrology Bldg (220), Rm. B-105. (NIST Contact: Beverly Kephart, 301-975-5777, bkephart@cme.nist.gov)

10:45 AM - NIST CENTER FOR NEUTRON RESEARCH SEMINAR: Evolution of the CE-phase in Layered Manganites
Recent study of the hole-doped manganites has been centered on the coexistence and interplay of various magnetic and electronic phases, which is believed to be responsible for the colossal magnetoresistance (CMR). Of particular importance is the insulating CE-phase, a collaborated charge/orbital/spins-ordered state that neighbors almost all other ordered phases in the doping-bandwidth phase diagram. The CE phase stabilizes at half doping (x=0.5) of perovskite manganites of relatively small band width. As hole density deviates from the half-doping, there is an asymmetry between the under- (x0.5) systems in charge/orbital order (CO/OO) as well as in magnetic orders. Studying how CE-phase evolves with hole-doping is a key to understand the origin of the complex states of manganites. In this talk a recent study of the static and dynamic magnetism in single-layered Pr1-xCa1+xMnO4 using neutron scattering technique will be represented. The magnetic structure of the half-doped system, the coexistence of commensurate and incommensurate magnetic orders in the underdoped region, and the origin of this coexistence will be discussed.
Songxue Chi , University of Tennessee, Knoxville. ,.
235 Bldg, Rm. E100. (NIST Contact: Jeff Lynn, 301-975-6246, jeffrey.lynn@nist.gov)


7/22 -- TUESDAY

No Scheduled Events

7/23 -- WEDNESDAY

3:30 PM - SURF SUMMER SEMINAR SERIES: Robots - Ready or Not?
Robots hold much promise as tools that will aid humans in a wide variety of missions and applications. They are being developed for military missions, transportation systems, factory automation, health care, and homeland security, to mention a few examples. Yet there are very few means – if any – of objectively and quantifiably determining whether robots are ready to be fielded or how effective they will be in accomplishing a particular job. To address this shortcoming, NIST is working with end-users and developers to define application-specific requirements for robot performance, devise test methods and metrics for evaluating the performance, and in generation of consensus standards. This talk will present the challenges in developing a measurement science for robotics and provide examples of the process used that abstracts application-specific real world challenges into quantifiable and reproducible tests.
Elena Messina , Acting Chief, Intelligent Systems Division, Manufacturing Engineering Laboratory.
Administration Bldg, Green Auditorium. (NIST Contact: Anita Sweigert, 301-975-4201, anita.sweigert@nist.gov)
Special Assistance; Contact A. Sweigert a week in advance.


7/24 -- THURSDAY

10:00 AM - CNST NANOFABRICATION RESEARCH GROUP SEMINAR: Dynamic Transmission Electron Microscope: Studying Nanoscale Material Processes with Nanosecond Time Resolution and Beyond
There have been many efforts in the past decades to improve the spatial resolution of transmission electron microscopes but little in way of improving the temporal resolution of in situ transmission electron microscopy. Most materials dynamics occur at rates much faster than can be captured with standard video rate acquisition methods. Thus, there is a need to increase temporal resolution in order to capture and understand salient features of these rapid materials processes. To meet the need for studying fast dynamics in material processes, we have constructed a nanosecond dynamic transmission electron microscope (DTEM) at Lawrence Livermore National Laboratory to improve the temporal resolution of in-situ TEM observations. The DTEM consists of a modified JEOL 2000FX transmission electron microscope that provides access for two pulsed laser beams. One laser drives the photocathode (which replaces the standard thermionic cathode) to produce the brief electron pulse. The other strikes the sample, initiating the process to be studied. A series of pump-probe experiments with varying time delays enable, for example, the reconstruction of the typical sequence of events occurring during the martensitic phase transformation. This presentation will discuss the core aspects of the DTEM instrument and how the DTEM has been used to study rapid solid-state phase transformations and chemical reactions. The latter half of the talk will layout near-term instrument development plans to extend the current 15ns-10nm spatio-temporal resolution and single frame acquisition to a versatile instrument that can explore material dynamics on the sub-picosecond to microsecond time scales and capture multi-frame movies of the transients states in material processes. Work was performed under the auspices of the U.S. Department of Energy, Lawrence Livermore National Laboratory and supported by the Office of Science, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering, of the U.S. Department of Energy under contract No. DE-AC52-07NA27344. References: Thomas LaGrange(1), Geoffrey H. Campbell(1), Bryan W. Reed(1), Nigel D. Browning(1,2), Judy S. Kim(1,2), James Evans(1) and Wayne E. King(1) 1)Materials Science and Technology Division, Chemistry, Materials, Earth and Life Science Directorate, Lawrence Livermore National Laboratory, PO Box 808, Livermore, CA 2) Department of Chemical Engineering and Materials Science, University of California-Davis, Davis, CA
Thomas LaGrange , Materials Science and Technology Division, Lawrence Livermore National Laboratory.
Bldg. 217, Rm. H107. (NIST Contact: James Liddle, 301-975-6050, james.liddle@nist.gov)


7/25 -- FRIDAY

10:45 AM - NIST CENTER FOR NEUTRON RESEARCH SEMINAR: Anisotropic Breakdown of the Fermi Liquid at a Quantum Critical Point
Over the last 30 years, the concept of the nearly-free electron gas has been pushed to its limits with the discovery of the so-called "heavy-fermion" class of metals. In these materials, strong interactions between electrons can reduce their velocities by as much as 1000 times but still allow them to behave as free particles, retaining the essence of the standard model of condensed matter - Landau's Fermi liquid theory. However, a growing number of materials have been shown to strongly deviate from this picture when they are "pushed" through an absolute-zero-temperature, or quantum, phase transition. The speaker will provide an overview of tunable quantum instabilities and their experimental investigations of the CeMIn5 (M=Co, Rh, Ir) heavy-fermion system, focusing on the use of ultra-low-temperature heat and charge transport measurements to test the validity of the nearly-free electron picture directly at a quantum phase transition. Their studies have shown the first profound breakdown of Landau's theory, as manifested in the violation of a robust physical law which has stood for over 150 years.
Johnpierre Paglione , University of Maryland. ,.
235 Bldg, Rm. E100. (NIST Contact: Mark Green, 301-975-4297, mark.green@nist.gov)

11:00 AM - CNST ELECTRON PHYSICS GROUP SEMINAR: Focused ion and electron beam nanofabrication: new developments
Both focused ion beams and electron beams can be used for direct, maskless, resistless nanofabrication as well as for lithography. So far the direct fabrication has been limited to applications such as photomask repair, circuit restructuring, failure analysis, and the creation of various highly specialized structures. Recent developments in maskless fabrication, so far aimed mainly at resist exposure, suggest that this picture might change. For example, IMS in Vienna, Austria is developing an instrument that can be characterized as an ion beam or electron beam dot matrix printer. The total current on the sample available from this kind of instrument is at least three orders of magnitude larger than from a single beam instrument. This may lead to new applications of charged particle beam fabrication, as well as enable applications considered in the past but rejected because of very low throughput. An example of one such application is the direct writing of the identity in RFID tags using ion beam implantation. Recently we have also shown that electron beams can be used to deposit relatively pure platinum from an inorganic precursor gas, Pt(PF3)4. Such metal deposits can be used as contacts to carbon nanotubes, semiconductor nano wires, organic fibers, or other structures where conventional lithography is impractical.
John Melngailis , Dept. of Electrical and Computer Engineering, University of Maryland, john.melngailis@nist.gov.
217 Bldg., H107 Rm.. (NIST Contact: Jabez J. McClelland, 301-975-3721, jabez.mcclelland@nist.gov)

1:30 PM - OFFICE OF THE DIRECTOR, NIST SEMINAR: Neutron Imaging for the Hydrogen Economy
This lecture will provide an overview of the tremendous advancements made in slow neutron imaging during the past decade. Neutron imaging is playing a significant role in the emerging hydrogen economy, in particular, in the development of low temperature fuel cells that may power consumer electronics, homes, and automobiles of the future. The lecture will highlight the contributions and impacts of neutron imaging in this important area of application.
Muhammad Arif , Physics Laboratory.
Administration Bldg, Green Auditorium. (NIST Contact: John Messina, 301-975-4284, john.messina@nist.gov)
Special Assistance Available

3:00 PM - FUNDAMENTAL PHYSICS SEMINAR: Constraining Isotropic Shifts in the Speed of Light
M. Hohensee , Harvard Univ., Cambridge, MA.
Radiation Physics Building, Rm. B105. (NIST Contact: Charles Clark, 301-975-3709, charles.clark@nist.gov)


ADVANCE NOTICE

7/28/08 10:30 AM - CNST ELECTRON PHYSICS GROUP SEMINAR: Electron beam projection nanopatterning using crystal lattice images obtained from high resolution transmission electron microscopy
The fabrication of nanometer-scale features such as quantum dots and quantum wires, in a controllable and economically viable manner is one of essential requirements for the production of highly functional devices. Here, we propose a new electron beam projection lithography technique for patterning nanometer scale, periodic structures. The novelty of this technique is that the crystalline lattice image observed by high resolution transmission electron microscopy (HRTEM) is employed as the ultimate mask to define nanometer scale pattern. Namely, the Ångstrom-scale lattice image of a crystalline material is magnified within the electron microscope, and is projected onto an electron-beam-resist-coated substrate. This technique is tentatively called AIPEL (Atomic Image Projection Electron-beam Lithography). To experimentally prove this concept, we developed the specially designed hardware based on the modification of a 200 kV TEM with a field emission gun (JEM-2010F, JEOL Ltd.). The patterning lenses for controlling the patterning magnification (50 to 300 times) were inserted below objective lens, and the wafer stage for loading the resist-coated wafer was installed in the lithography plane, as shown in Fig. 1. Using this technique, we successfully fabricated periodic arrays of dot and line patterns with feature sizes of about 25 nm using single-crystalline Si as the mask materials. Moreover, the HRTEM images which can be obtained from crystalline samples can be far more complicated. Fig. 2 shows the various patterned structures obtained from crystalline ?-silicon nitride (?-Si3N4) sample with hexagonal crystal system (P63/m). The patterning results of these complicated and interesting nanostructures not only demonstrate the uniqueness of this method but also open up a whole new area of investigating a variety of electrical, optical, and magnetic properties of nanostructures.
Ki Bum Kim , Professor /Seoul National University-Dept. of Materials Sci. and Eng., Seoul, Korea, kibum@snu.ac.kr.
217 Bldg., H107 Rm.. (NIST Contact: Jabez J. McClelland, 301-975-3721, jabez.mcclelland@nist.gov)

7/29/08 10:30 AM - CNST NANOFABRICATION RESEARCH GROUP SEMINAR: Nanoscale measurements for photovoltaics: advances and challenges
The quest to control semiconductor morphologies at the nanoscale has been largely motivated by the prospect of obtaining interesting new properties differing from the bulk. In the case of photovoltaic applications, bandgap modification can be obtained from quantum confinement below the exciton Bohr radius in nanodots, and charge mobility can significantly increase in nanowires and nanorods, because of reduced grain boundaries. The discovery of new photovoltaic structures such as bulk organic heterojunctions and semiconductor nanowires has also created the need for new characterization methods than can probe the local structure at the scale of exciton diffusion length, and correlate it with overall device power conversion efficiency. Nanostructured semiconductors such as single wall carbon nanotube transparent conducting films, Zinc oxide nanotips arrays, and Germanium nanowires coatings have been developed at the Rutgers Institute for Advanced Materials, Devices and Nanotechnologies (IAMDN). We will present their evaluation in photovoltaic devices, and illustrate some of the challenges that such measurements represent. For instance, photoelectrical measurement of nanosized objects is made difficult by the need to make electrical contact to them. A preferred approach is to generate phase-locked photocurrent and photoluminescence with a nanosized spot of chopped light, and build an image by mapping the sample. We will report our initial results towards this goal with photocurrent microscopy on silicon solar cells, and discuss strategies to increase resolution from tens of microns to tens of nanometers. Finally, we expose our plans to measure local photoluminescence quenching and exciton lifetime in nanoscale photovoltaic objects. References: Aurelien Du Pasquier, Husnu Emrah Unalan, Alokik Kanwal and Manish Chhowalla, Applied Physics Letters 87,1,(2005). A. D. Pasquier, H. Chen, G. Saraf, J. Zhong, Y. Lu, Appl. Phys. Lett. 89, 253513 (2006). Hanhong Chen, Aurelien Du Pasquier, Gaurav Saraf, Jian Zhong and Yicheng Lu, Semicond. Sci. Technol. 23 045004 (2008). Aurelien Du Pasquier, Daniel D. T. Mastrogiovanni, Lauren A. Klein, Tong Wang, and Eric Garfunkel, Appl. Phys. Lett. 91, 183501 (2007). http://iamd.rutgers.edu/
Aurelien Pasquier , Research Assistant Professor, Rutgers University.
Bldg. 217, Rm. H107. (NIST Contact: Nikolai Zhitenev, 301-975-6039, nikolai.zhitenev@nist.gov)

7/30/08 1:30 PM - BUILDING ENVIRONMENT DIVISION SEMINAR: BFRL Seminar: The Hydrogen Economy and Our Energy Future
The advent of fuel cells that can efficiently transform the chemical energy in a fuel directly into electricity has excited both the technical community and the general public and raised an expectation that these advancements may provide a way around a foreseeable energy shortage. Leading the list of expectations are efficient electric vehicles fueled with domestically-produced hydrogen having no harmful environmental emissions. The use of fuel cell systems for stationary power production has also generated excitement because of the high electrical efficiencies, the cogeneration opportunities and the low emissions expected from these systems. The opportunities presented by hydrogen-fueled fuel cell systems has provided impetus for transformation from a petroleum to a hydrogen economy in which domestically-produced hydrogen would be transported in a manner similar to natural gas. The objectives of this seminar are to briefly review the different fuel cell concepts that are currently receiving developmental attention. Then the characteristics of hydrogen will be reviewed in order to determine its feasibility as a transportation fuel and the merits of a hydrogen economy. The advantages and disadvantages of using fuel cell systems for transportation and stationary power applications will be reviewed. Finally the role fuel cell systems may be expected to have in our energy future will be discussed.
Dr. Sanford Klein , Director of the Solar Energy Laboratory, UW, Madison, WI. Matthew Boyd , Graduate Research Assistant, UW, Madison, WI.
Polymer Building, Room B245. (NIST Contact: Brian Dougherty, 301-975-6396, brian.dougherty@nist.gov)

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MEETINGS ELSEWHERE


7/21 -- MONDAY

No Scheduled Events

7/22 -- TUESDAY

No Scheduled Events

7/23 -- WEDNESDAY

No Scheduled Events

7/24 -- THURSDAY

No Scheduled Events

7/25 -- FRIDAY

No Scheduled Events

ADVANCE NOTICE

No Scheduled Events

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TALKS BY NIST PERSONNEL

HIGHT WALKER, A. : LENGTH-DEPENDENT OPTICAL PROPERTIES OF SINGLE-WALLED CARBON NANOTUBES.
International Conference on Nanoscience & Technology, Keystone Conference Center, Keystone CO, 7/21.

KLINE, J. : ENABLING PLASTIC ELECTRONICS THROUGH STRUCTURE PROPERTY RELATIONSHIPS.
World Materials Research Institute Forum, Tsukua, Japan, 7/22.

FLETCHER, R. : "TEST PARTICLES FOR FIELD VERIFICATION OF ION MOBILITY SPECTROMETERS.
17th Annual Conference on Ion Mobility Spectrometry, Ottawa, Ontario, Canada, 7/23.

VERKOUTEREN, M. : PROPOSED STANDARD METHOD FOR DETERMINATION OF LOD IN TRACE CONTRABAND DETECTORS.
17th International Conference on Ion Mobility Spectrometer, Ottawa, Ontario, Canada, 7/24.

VERKOUTEREN, J. : RELIABILITY OF IMS FOR THE ANALYSIS OF MULTICOMPONENT ILLICIT DRUG FORMULATIONS AND DIVERTED PHARMACEUTICALS.
17th International Conference on Ion Mobility Spectrometers, Ottawa, Ontario, Canada, 7/24.

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ANNOUNCEMENTS

2008 WORLD STANDARDS DAY PAPER COMPETITION
The U.S. standards community will celebrate World Standards Day on Thursday, October 23, 2008, at the Ronald Reagan Building and International Trade Center in Washington, DC. The theme for this year's celebration, "Intelligent and Sustainable Buildings," recognizes the critical role of standards and conformity assessment programs in ensuring safety requirements; facilitating coordination among contractors, builders, engineers, and architects; and incorporating new technologies in design and construction. In conjunction with this year's event, the 2008 World Standards Day sponsors, including NIST will hold the annual paper competition. The 2008 World Standards Day Paper Competition invites papers that use specific examples to show ways that standards and conformity assessment programs are used for intelligent and sustainable buildings. Paper competition winners will be announced and given their awards at the US celebration of World Standards Day. The first place winner will receive a plaque and $2,500. Second and third place winners will receive $1,000 and $500, respectively, along with a certificate. In addition, the winning papers will be published in SES's journal, "Standards Engineering." ELIGIBILITY: The competition is open to U.S.-based individuals in the private sector, government, or academia. Papers may be co-authored. RULES: Entries must be original and not previously published. NIST papers must be processed through WERB or BERB. All paper contest submissions must be received with an official entry form by midnight on August 29, 2008, by the SES Executive Director, 13340 SW 96th Avenue, Miami, Florida, 33176. Complete details and official entry forms are available on the SES website www.ses-standards.org (follow the link for "2008 WSD Paper Competition.") For additional information about the U.S. Celebration of World Standards Day, or to register for the event, please visit www.wsd-us.org.
NIST Contact: Mary Donaldson, 301-975-6197, mary.donaldson@nist.gov

PUBLICATIONS PRINTING DEADLINE AUGUST 14, 2008
August 14 is the last day in FY 2008 to submit materials using FY 2008 funds to the Electronic Information and Publications Group (EIPG) for printing at the Department of Commerce or Government Printing Office. To assure timely processing, bring your Editorial Review Board-approved document or administrative printing job and appropriate paperwork to the EIPG office by close of business on Thursday, August 14, 2008. The office is located on the mezzanine floor of the NIST Research Library in the Admin Building, Room E220. Questions? Ilse Putman, x2780 or Barbara Silcox, x2146.
NIST Contact: Ilse Putman, 301-975-2780, ilse.putman@nist.gov

VISITOR REGISTRATION FOR NIST EVENTS
Because of heightened security at the NIST Gaithersburg site, members of the public who wish to attend meetings, seminars, lectures, etc. must first register in advance. For more information please call or e-mail the "NIST Contact" for the particular event you would like to attend.
NIST Contact: . ., ., .

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NIST WEB SITE ANNOUNCEMENTS

No Web Site announcements this week.

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For more information, contact Ms. Sharon Hallman, Editor, Stop 2500, National Institute of Standards and Technology, Gaithersburg MD 20899-2500; Telephone: 301-975-TCAL (3570); Fax: 301-926-4431; or Email: tcal@nist.gov.

All lectures and meetings are open unless otherwise stated.

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